Results 241 to 250 of about 59,923 (299)
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XRF induced by PIXE: Comparison with radioisotope XRF
Applied Physics A Solids and Surfaces, 1987XRF induced by PIXE (XRF-PIXE) using silver as a primary target was compared with a standard radioisotope XRF system using Cd-109 as a primary exciting source, for the analysis of single-element thin standards. The sensitivity of the two methods were determined for elements from Cl to Mo.
K. A. Al-Saleh, J. D. Meyer, N. S. Saleh
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Application of XRF and field portable XRF for environmental analysis
Journal of Radioanalytical and Nuclear Chemistry, 2004The aim of the present review is to evaluate, on the basis of published papers, the real potential of XRF technique for environmental analysis. Special attention is given for the determination of heavy metal pollution in water. Results of numerous papers for various samples are presented.
F. L. Melquiades, C. R. Appoloni
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Advances in X-ray Analysis, 1986
AbstractX-ray fluorescence, or X-ray spectrometry, is a dynamic analytical method; it undergoes constant change and improvement. Because of the early successes for the analysis of difficult samples such as metals, minerals and other solid materials, the technique was widely accepted in industrial applications.
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AbstractX-ray fluorescence, or X-ray spectrometry, is a dynamic analytical method; it undergoes constant change and improvement. Because of the early successes for the analysis of difficult samples such as metals, minerals and other solid materials, the technique was widely accepted in industrial applications.
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XRF and Raman Characterization of Antimonite
Instrumentation Science & Technology, 2009Abstract Two type Antimonite (stibnite) ore samples were analyzed by polarized energy dispersive X-ray fluorescence (PEDXRF) spectrometry and by confocal Raman spectrometry (CRS) in this study. The samples were collected from two different localities (Izmir-Odemis and Bursa-Uludag zones from Turkey) according to the sampling methods. The first locality
Kadolu, Yusuf Kağan +4 more
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Paintings? a challenge for XRF and PIXE analysis
X-Ray Spectrometry, 2000Conventional pigment analysis of paintings requires the removal of micro-samples followed by the preparation of cross-sections. There are also requirements for investigating several locations within a painting in order to obtain information about dating and provenance or the reason for aesthetic impressions of the paint materials. The need to carry out
Neelmeijer, C. +9 more
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Advances in X-ray Analysis, 1993
As in other fields of spectroscopy, software for x-ray fluorescent analysis has to assist the user in instrument control, raw data refinement, qualitative interpretation of spectral data, and computations for obtaining quantitative results. From a historical point of view, instrument automation and data evaluation routines tor large numbers of samples ...
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As in other fields of spectroscopy, software for x-ray fluorescent analysis has to assist the user in instrument control, raw data refinement, qualitative interpretation of spectral data, and computations for obtaining quantitative results. From a historical point of view, instrument automation and data evaluation routines tor large numbers of samples ...
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Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1995
Information on the Beijing Synchrotron Radiation Facility (BSRF), the equipment of the Synchrotron Radiation XRF experimental station and the major XRF experiments performed at this station are given.
Ying Rong Wu +4 more
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Information on the Beijing Synchrotron Radiation Facility (BSRF), the equipment of the Synchrotron Radiation XRF experimental station and the major XRF experiments performed at this station are given.
Ying Rong Wu +4 more
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Trends in quantification in XRF
X-Ray Spectrometry, 1991Abstract Trends in the areas of analysis of low atomic number elements, routine quantitative analysis, matrix correction methods, qualitative analysis, set up and calibration, data processing and lower limits of detection are given, based on a short overview of the past, and extrapolating to the future.
B. A. R. Vrebos, G. T. J. Kuipéres
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Microscopy and Microanalysis, 2004
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
Brian John Cross, K C Witherspoon
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
Brian John Cross, K C Witherspoon
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Alumina Characterization by XRF
Advances in X-ray Analysis, 1989One of the most important properties that characterizes alumina is its elemental composition. Although XRF has been applied to the analysis of aluminas for the past three decades, special aluminas have always presented a maj or challenge. Moreover, only recently did it become possible to analyze for light elements such as Na. Two new sample preparation
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