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A General Yield Model From Design to Product Engineering
IEEE Transactions on Semiconductor Manufacturing, 2009This paper proposes a yield model for integrated circuits that includes the impact of design measures for robust design as well as traditional defect density parameters. This model is a powerful extension to common practice at silicon foundries and integrated device manufacturers.
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Overview of Wafer-level Electrical Failure Analysis Process for Accelerated Yield Engineering
Microelectronics Failure Analysis, 2019S. Goh+9 more
semanticscholar +1 more source
Enhancing grain-yield-related traits by CRISPR–Cas9 promoter editing of maize CLE genes
Nature Plants, 2021Lei Liu+7 more
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Light-driven CO2 sequestration in Escherichia coli to achieve theoretical yield of chemicals
Nature Catalysis, 2021Guipeng Hu+7 more
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Engineering of high yield production of L‐serine in Escherichia coli
Biotechnology and Bioengineering, 2016Hemanshu Mundhada+3 more
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