Results 221 to 230 of about 290,141 (263)
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Yield Estimation and Prediction
1990Due to inherent fluctuations in any integrated circuit manufacturing process, the yield (which is nominally viewed as the ratio of the number of chips that perform correctly, i.e., meet all performance specifications, to the number of chips manufactured) is always less than 100%.
Stephen W. Director +2 more
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Yield and yield prediction of guinea grass pastures
1987Native pastures are the most important source of feed for the livestock industry in St. Croix, U.S.V.I. One of the major constituents of these pastures is guinea qrass (Panicum maximum), found in well managed, properly stocked situations. To determine the dry matter production of this species, plots were established in existing swards located in ...
Michaud, M.W. +3 more
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Groundwater, 1967
ABSTRACT Two case histories are presented which illustrate that by analyzing drill cuttings or bailed samples, by knowing total depth of a test hole and position of the static water level, and by studying the driller's log, not only can a well's yield be predicted—but also drawdown may be predicted for any well in advance of a pumping
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ABSTRACT Two case histories are presented which illustrate that by analyzing drill cuttings or bailed samples, by knowing total depth of a test hole and position of the static water level, and by studying the driller's log, not only can a well's yield be predicted—but also drawdown may be predicted for any well in advance of a pumping
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Liquidity Yield and Exchange Rate Predictability
SSRN Electronic Journal, 2020In this paper, we extend the Taylor rule model of exchange rate determination by incorporating the liquidity yield on government bonds and investigate exchange rate predictability. We find that the liquidity yield on government bonds delivers additional predictive power to future exchange rate movements beyond the model with Taylor rule fundamentals ...
Shiu-Sheng Chen, Yu-Hsi Chou
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Testing the Predictive Power of Dividend Yields
The Journal of Finance, 1993ABSTRACTThis paper reexamines the ability of dividend yields to predict long‐horizon stock returns. We use the bootstrap methodology, as well as simulations, to examine the distribution of test statistics under the null hypothesis of no forecasting ability.
Goetzmann, William Nelson +1 more
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Predicting the frequencies of transgressive segregants for yield and yield components in wheat
Theoretical and Applied Genetics, 1982Genetical analysis of the F2 triple test cross design combined with conventional early generations was used to elucidate the genetical control of yield and yield components in two crosses of winter wheat. From estimates of the additive, {d}, and additive X additive, {i}, components of means, together with the additive genetical variance, D, predicted ...
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Modelling of Plant Growth for Yield Prediction
Agricultural Meteorology, 1974ABSTRACT Splinter, W. E., 1974. Modelling of plant growth for yield prediction. Agric. Meteorol., 14: 243–253. A corn growth model is presented which requires three basic input parameters: average daily light intensity (ly), average daily temperature (°C) and soil resistance block reading (Ohms).
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Yield prediction by sampling with the EYES tool
Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002This paper reports a software system EYES (Edinburgh Yield Estimator Sampling) for the yield prediction of ULSI devices. The system implements the survey sampling based methodology for critical area estimation and yield prediction. This methodology is not limited by the size of the device or the design hierarchy and can provide yield predictions in a ...
Gerard A. Allan, Anthony J. Walton
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Yield prediction by sampling IC layout
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2000This paper reports a survey sampling-based methodology for critical area and other property estimates of IC layout. A software implementation of the method, Edinburgh yield estimator sampling (EYES) is presented. The EYES tool implements the survey sampling-based methodology for critical area estimation enabling the yield prediction of ULSI chips.
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Research on Apple Yield Prediction Model
2019This paper has used a fuzzy comprehensive prediction method and taken tree vigor data from 29 orchards as samples. By using 23 of the total samples, the apple yield prediction model base on tree vigor is established. The test precision of the model is 96.36%.
Zhijun Wang +3 more
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