Results 41 to 50 of about 161,989 (332)

Role of oxygen vacancies in ferroelectric or resistive switching hafnium oxide

open access: yesNano Convergence, 2023
HfO2 shows promise for emerging ferroelectric and resistive switching (RS) memory devices owing to its excellent electrical properties and compatibility with complementary metal oxide semiconductor technology based on mature fabrication processes such as
Jaewook Lee   +7 more
doaj   +1 more source

Band offsets of semiconductor heterostructures: a hybrid density functional study [PDF]

open access: yes, 2010
We demonstrate the accuracy of the hybrid functional HSE06 for computing band offsets of semiconductor alloy heterostructures. The highlight of this study is the computation of conduction band offsets with a reliability that has eluded standard density functional theory.
arxiv   +1 more source

Covalently‐Bonded Diaphite Nanoplatelet with Engineered Electronic Properties of Diamond

open access: yesAdvanced Functional Materials, EarlyView.
A novel approach to engineering the electronic properties of diamond is reported on the diaphite nanoplatelet consisting of (11¯${{\bar{1}}}$1) planes of diamond nanoplatelet covalently bonded with graphite (0001) planes. The strong sp3/sp2‐hybridized interfacial covalent bonding induces the electron transfer from diamond to graphite, resulting in a ...
Zhaofeng Zhai   +9 more
wiley   +1 more source

Research on Test Method of Ignition Temperature of Electric Explosive Device under Electromagnetic Pulse [PDF]

open access: yesRadioengineering, 2021
The safety and reliability of electric explosive device, as the most sensitive initiating energy for igniting powder and explosive, directly impact those of weapon system. The safety and reliability of the electric explosion device were determined by the
B. Wang   +4 more
doaj  

Removing Homocoupling Defects in Alkoxy/Alkyl‐PBTTT Enhances Polymer:Fullerene Co‐Crystal Formation and Stability

open access: yesAdvanced Functional Materials, EarlyView.
PBTTT‐OR‐R, a C14‐alkoxy/alkyl‐PBTTT polymer derivative, is of substantial interest for optoelectronics due to its specific fullerene intercalation behavior and enhanced charge‐transfer absorption. Comparing this polymer with (S) and without (O) homocoupling defects reveals that PBTTT‐OR‐R(O) forms stable co‐crystals with PC61BM, while PBTTT‐OR‐R(S ...
Zhen Liu   +14 more
wiley   +1 more source

Reliability assessment of high-power GaN-HEMT devices with different buffers under influence of gate bias and high-temperature tests

open access: yesApplied Physics Express
This study compares Vth-instability in D-mode MIS-HEMT devices between two epitaxial layers, AlN/AlGaN/GaN superlattice-W1, and three-step graded AlGaN-W2.
Shivendra K. Rathaur   +3 more
doaj   +1 more source

Photo‐Assisted Zn‐Iodine Battery via Bifunctional Cathode with Iodine Host and Solar Response Boost

open access: yesAdvanced Functional Materials, EarlyView.
A bifunctional cathode based on BiOI materials is developed for photo‐assisted Zn‐iodine batteries, serving as both an iodine host and a solar‐responsive material. This design enables dual reaction routes involving vacancy‐based iodine storage and reversible two steps iodine redox.
Hai Xu   +4 more
wiley   +1 more source

The reliability of the power semiconductor module on the operating temperature

open access: yesMATEC Web of Conferences, 2014
A comparison of the intensities of the failure of a power unit with the real thermal regime of the device under conditions of natural convection and obtained by using statistical data analysis.
Kravchenko Evgeny V., Ivleva Dariya Yu.
doaj   +1 more source

Soft-switching SiC power electronic conversion for distributed energy resources and storage applications

open access: yesJournal of Modern Power Systems and Clean Energy, 2019
Power electronic conversion plays an important role in flexible AC or DC transmission and distribution systems, integration of renewable energy resources, and energy storage systems to enhance efficiency, controllability, stability, and reliability of ...
Keyan Shi   +3 more
doaj   +1 more source

A Machine Learning Approach to Predicting Single Event Upsets [PDF]

open access: yesarXiv, 2023
A single event upset (SEU) is a critical soft error that occurs in semiconductor devices on exposure to ionising particles from space environments. SEUs cause bit flips in the memory component of semiconductors. This creates a multitude of safety hazards as stored information becomes less reliable.
arxiv  

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