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150 kV/1 kHz可调脉宽电晕等离子体驱动源

, 2010
冯宗明   +4 more
semanticscholar   +1 more source

γ射线辐照对130 nm部分耗尽SOI MOS器件栅氧经时击穿可靠性的影响

, 2018
马腾   +7 more
semanticscholar   +1 more source

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