Results 11 to 20 of about 6,289 (118)

Temperature‐Induced Transformation of Oxidation Mechanism in HfZrTiTa0.5Al0.5 Refractory High‐Entropy Alloy: The Role of Elemental Segregation and Lattice Defects

open access: yesRare Metals, Volume 45, Issue 5, May 2026.
ABSTRACT Refractory high‐entropy alloys (RHEAs) face severe oxidation challenges at elevated temperatures, despite their outstanding mechanical properties. Consequently, understanding the oxidation mechanisms of RHEAs is crucial for their high‐temperature applications.
Zheng Tian   +7 more
wiley   +1 more source

Overreliance on Orthographic Similarity in L2‐Japanese Conceptual Processing by L1‐Chinese Learners

open access: yesInternational Journal of Applied Linguistics, Volume 36, Issue 2, Page 1807-1820, May 2026.
ABSTRACT Orthographic and phonological similarities between first (L1) and second (L2) languages can facilitate L2 processing. Particularly, L1‐Chinese learners of L2‐Japanese can benefit from the shared morphosyllabic Chinese characters (Japanese kanji/Chinese hanzi) because of their similar orthographies.
Xuehan Zhao, Kexin Xiong, Sachiko Kiyama
wiley   +1 more source

基于红外检测的GIS内部过热缺陷严重程度的评估方法研究

open access: yesGaoya dianqi, 2018
为研究基于红外检测的GIS内部过热缺陷严重程度的评估方法,分别在母线三相共箱结构GIS腔体内的A相和B相设置"工"字形导体,模拟GIS内部导体接触不良引起的过热缺陷,开展了不同电流下的GIS温升实验。实验中,采用电子式测温技术和红外测温技术分别对GIS内部导体以及壳体的温度进行测量。实验结果表明,模拟缺陷分别设置于A相和B相时,前者内部导体和壳体的温升均高于后者。内部导体和壳体的温升在轴向上呈现出先升高后降低的变化趋势,模拟缺陷处的温升值最大。通过分析内部导体和壳体的温升关系 ...
刘凯   +4 more
doaj  

GIS固体绝缘缺陷所激发特高频信号时频特征研究

open access: yesGaoya dianqi, 2021
利用特高频局部放电检测方法及时发现并处理气体绝缘金属封闭开关设备(GIS)内部固体绝缘缺陷,是GIS设备运维的重要手段。目前将异常特高频信号与现行标准、规范和典型模拟缺陷图谱进行比对从而诊断缺陷类型及严重程度的方法,因现场情况复杂、设备结构各异,准确性有待进一步提升。因此文中针对现场检测中发现的GIS固体绝缘表面放电缺陷和内部气隙放电缺陷,研究该类缺陷所激发特高频局部放电信号的PRPS统计图谱特征,并利用傅里叶变换和连续小波变换分析单次特高频原始脉冲的频谱特征和时频特征 ...
周电波   +6 more
doaj  

Recent Advances in Piezocatalysis and Piezo‐Photocatalysis in Energy and Environment: Materials, Design, and Applications

open access: yesRare Metals, Volume 45, Issue 4, April 2026.
ABSTRACT Piezocatalytic technology utilizes mechanical strain or stress‐induced piezoelectric phenomena to produce robust internal electric fields, markedly improving the separation efficiency of e−‐h+ pairs. This method has emerged as a focal point in catalysis by removing reliance on conventional light or electrical energy via its mechanical‐to ...
Yue Zhou   +5 more
wiley   +1 more source

GIS设备异物缺陷X射线检测研究

open access: yesGaoya dianqi, 2019
SF6气体绝缘全封闭组合电器(GIS)内部可能出现金属微粒等异物缺陷导致故障,因此对GIS设备内部的异物缺陷故障进行检测具有重要的意义。X射线成像法是一种检测GIS设备内部缺陷的有效方法,但缺乏成熟的参数选择方法。文中对X射线检测的基本理论进行了介绍,对GIS设备X射线检测参数选择方法进行了讨论,并为220kV GIS设备内异物缺陷检测选择了合适的参数。在选定参数下,使用双丝像质计对射线成像系统的不清晰度进行了研究,验证了X射线对金属微粒缺陷检测的可行性 ...
周艺环   +5 more
doaj  

h‐BN/HfO2 Interface‐Enabled Optoelectronic Doping for Low‐Voltage, Reconfigurable MoTe2 Nanoelectronics

open access: yesRare Metals, Volume 45, Issue 4, April 2026.
ABSTRACT Engineering the semiconductor/dielectric interface is crucial for advancing two‐dimensional (2D) nanoelectronics, where device performance is predominantly governed by interfacial defects and dielectric coupling. Optoelectronic doping based on carrier trapping at the h‐BN/SiO2 interface has enabled non‐volatile and reversible carrier ...
Zhe Zhang   +6 more
wiley   +1 more source

检测GIS固体绝缘内部放电缺陷的特高频和X射线数字成像联合方法研究

open access: yesGaoya dianqi, 2017
相比超声波局部放电检测法,特高频局部放电检测法对GIS固体绝缘内部放电缺陷检测灵敏度和定位精度较高,但由于无法确证此类缺陷部位和类型,据此制定的设备检修策略难以保证完善、准确。因此,本文研究了特高频局部放电和X射线数字成像联合检测GIS固体绝缘内部放电缺陷的方法,使用特高频局部放电检测法对固体绝缘缺陷进行检测和定位后,在设备检修期间应用X射线数字成像技术对缺陷进行可视化确证。该方法在某110 kV变电站110 kV GIS的带电检测中成功发现隔离开关绝缘拉杆内部电树枝缺陷 ...
雷汉坤, 贾志杰
doaj  

Engineering a Tumor‐Targeted MgH2@Lip/PD‐L1 Nanoplatform for Synergistic Hydrogen Therapy and Immune Activation

open access: yesRare Metals, Volume 45, Issue 3, March 2026.
ABSTRACT Lung cancer remains the leading cause of cancer‐related deaths worldwide, yet immune checkpoint blockade (ICB) is often compromised by an immunosuppressive tumor microenvironment (TME) with acidosis, hypoxia, and poor T cell infiltration. Here, we develop a TME‐responsive nanoplatform (MgH2@Lip/PD‐L1) that couples hydrogen gas therapy with PD ...
Xuyu Gu   +5 more
wiley   +1 more source

组合电器盆式绝缘子内部气隙缺陷的带电检测与分析

open access: yesGaoya dianqi, 2012
笔者通过局部放电超高频检测、缺陷定位、模式识别以及解体等,分析了一起组合电器GIS盆式绝缘子内部气隙缺陷,阐述了基于信号能量衰减法和到达时延法的缺陷精确定位过程,又根据超高频信号PRPD谱图特征对缺陷类型进行了识别,最后通过解体查找到了该内部气隙缺陷。
周云锋, 杨景刚, 张子阳
doaj  

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