Results 281 to 290 of about 2,572,717 (328)

Mapping Nanoscale Buckling in Atomically Thin Cr2Ge2Te6

open access: yesAdvanced Functional Materials, EarlyView.
Atomic‐resolution STEM is used to resolve nanoscale buckling in monolayer Cr2Ge2Te₆. A noise‐robust image analysis reconstructs three‐dimensional lattice distortions from single plan‐view images, revealing pronounced defect‐driven nm‐scale out‐of‐plane buckling.
Amy Carl   +20 more
wiley   +1 more source

Unveiling Energy Dynamics of Battery Electric Vehicle Using High-Resolution Data. [PDF]

open access: yesSci Data
Yasko M   +5 more
europepmc   +1 more source

On the Acoustic Noise Radiated by PWM AC Motor Drives

open access: green, 2003
Stefan Laurentiu Capitaneanu   +3 more
openalex   +1 more source

Mitigating Ion Migration with Alternating Voltage for Stable Perovskite Image Sensors. [PDF]

open access: yesACS Appl Mater Interfaces
Tsarev S   +10 more
europepmc   +1 more source

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