Results 211 to 220 of about 1,219,708 (305)

Interval estimation of the two-parameter exponential constant stress accelerated life test model under Type-II censoring

Quality Technology & Quantitative Management, 2022
In this paper, interval estimation of the two-parameter exponential distribution based on constant-stress accelerated life test data under Type-II censoring is studied.
Wenhui Wu, B. Wang, Jiayan Chen, J. Miao, Qingyuan Guan   +4 more
semanticscholar   +1 more source

On estimation procedures of constant stress accelerated life test for generalized inverse lindley distribution

Quality and Reliability Engineering International, 2021
In manufacturing industries and several other fields, accelerated life testing is used widely to obtain sufficient failure time data of test units quickly as compared to normal use conditions.
Devendra Kumar, M. Nassar, S. Dey, F. Alam   +3 more
semanticscholar   +1 more source

Designing Bayesian sampling plans for simple step-stress of accelerated life test on censored data

Journal of Statistical Computation and Simulation, 2021
This paper studies the problem about how to design a Bayesian sampling plan (BSP) for two exponential distributions linked by the cumulative exposure model through a simple step-stress accelerated life test (ALT).
Lee-Shen Chen, T. Liang, Ming-Chung Yang
semanticscholar   +1 more source

Optimality in Accelerated Life Tests

Mathematics of Operations Research, 1992
We formulate a stochastic control problem arising from the optimal design of accelerated life tests. The model is obtained, in a natural way, in the setup of point processes. The cost functional depends on the total number of items under test at time t, the observed number of items failed up to time t, and the stress level applied to the items under ...
G. Del Grosso, Anna Gerardi, Giorgio Koch   +2 more
openaire   +2 more sources

Design optimization of a simple step-stress accelerated life test - Contrast between continuous and interval inspections with non-uniform step durations

Reliability Engineering & System Safety, 2020
Thanks to continuously advancing technology and manufacturing processes, the products and devices are becoming highly reliable. However, performing the life tests of these products at normal operating conditions becomes extremely difficult, if not ...
David Han, T. Bai
semanticscholar   +1 more source

Nonparametric Accelerated Life Testing

IEEE Transactions on Reliability, 1982
This paper considers the problem of nonparametric accelerated life testing by extending the results of Shaked & Singpurwalla in two directions. First we solve the case of censored data. Next we extend the methods to the case of competing risks. A s-consistent estimate of the failure distribution at use-stress is given for both cases.
Basu, A. P., Ebrahimi, Nader
openaire   +2 more sources

Generalized inverted exponential distribution under constant stress accelerated life test: Different estimation methods with application

Quality and Reliability Engineering International, 2020
Estimation of the parameters of generalized inverted exponential distribution is considered under constant stress accelerated life test. Besides the maximum likelihood method, nine different frequentist methods of estimation are used to estimate the ...
S. Dey, M. Nassar
semanticscholar   +1 more source

Development of Accelerated Life Test

2008 IEEE Conference on Robotics, Automation and Mechatronics, 2008
This paper summarizes the development of accelerated life test types, model, statistical method and its progress. To the mechatronic component whose failure mechanism is related to various operational stresses, the best way is to exploit variable stress accelerated life test (ALT), obtain the likelihood function with failure accumulative method, and ...
Sijun Zhao, Shaoping Wang, Jian Shi, Lan Li   +3 more
openaire   +1 more source

Analyses of microstructure at degraded local area in Ni-multilayer ceramic capacitors under highly accelerated life test

Japanese Journal of Applied Physics, 2020
Microstructures at degraded local areas have been analyzed, using ‘prebreakdown’ multilayer ceramic capacitors (MLCCs), degraded by a highly accelerated life test (HALT).
M. Nagayoshi, K. Matsubara, Nobuyoshi Fujikawa   +2 more
semanticscholar   +1 more source

Accelerated life tests of ceramic capacitors

38th Electronics Components Conference 1988., Proceedings., 1988
Multilayer capacitors prepared from three different ceramics were tested under highly accelerated conditions of both voltage and temperature. Three types of breakdown were encountered: avalanche, fast thermal degradation, and diffusion or wearout. The goal was to determine whether data from highly accelerated life tests could be used to plot failure ...
B. Mogilevsky, G. Shirn
openaire   +1 more source