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Highly accelerated life testing (HALT): A review from a statistical perspective
WIREs Computational StatisticsDespite its use in one form or another for at least four decades, HALT and related techniques [e.g., highly accelerated‐stress screening (HASS) and stress audits (HASA)] are not well understood within the statistical community and remain controversial ...
D. Collins, A. Huzurbazar, R. Warr
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European Journal of Operational Research, 2021
Shuidan Qin, B. Wang, Wenhui Wu, Chao Ma
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Shuidan Qin, B. Wang, Wenhui Wu, Chao Ma
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Accelerated Life Testing of Capacitors
IRE Transactions on Reliability and Quality Control, 1957One of the problems facing the designer of modern electronic communication systems is the ultimate reliability to be achieved under service conditions. The required level of reliability together with the unavoidable complexity of present-day equipment calls for components having extremely low failure rates.
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Model-Robust Test Plans With Applications in Accelerated Life Testing
Technometrics, 2003We study a criterion based on a weighted asymptotic sample ratio (ASR) that yields model-robust test plans with relatively low ASRs under different models. We apply the criterion to accelerated life test planning in which interest lies in estimating life quantiles and there is uncertainty as to whether the Weibull or the lognormal model best describes ...
Francis G. Pascual, Grace Montepiedra
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A general hazard regression modelfor accelerated life testing
Annals of Operations Research, 1999zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Huan-Jyh Shyur +2 more
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Estimation for a weibull accelerated life testing model
Naval Research Logistics Quarterly, 1984AbstractIt is sometimes reasonable to assume that the lifetime distribution of an item belongs to a certain parametric family, and that actual parameter values depend upon the testing environment of the item. In the two‐parameter Weibull family setting, suppose both the shape and scale parameters are expressible as functions of the testing environment.
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Accelerated Life Tests at Higher Usage Rates
IEEE Transactions on Reliability, 2005Accelerated life tests are extensively used to provide quickly the information about the life distributions of products. Test units are subjected to elevated stresses which yield shorter lives. For some products whose life is defined by usage, e.g., mileage and cycles, test units are also run at higher usage rates (UR) to compress the test time.
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Optimum step‐stress for temperature accelerated life testing
Quality and Reliability Engineering International, 2007AbstractStep‐stress accelerated life testing is a design strategy where the stress is modified several times during the test. In this work we address the problem of designing such a test. We focus on temperature accelerated life testing and we address the problems of setting the step duration and the stress levels.
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