Results 1 to 10 of about 36,992 (256)

Semi‐quantitative temperature accelerated life test (ALT) for the reliability qualification of concentrator solar cells and cell on carriers [PDF]

Progress in Photovoltaics: Research and Applications, 2015
AbstractAn adequate qualification of concentrator photovoltaic solar cells and cell‐on‐carriers is essential to increase their industrial development. The lack of qualification tests for measuring their reliability together with the fact that conventional accelerated life tests are laborious and time consuming are open issues.
Núñez Mendoza, Neftalí, Vázquez López, Manuel, Orlando, Vincenzo, Espinet González, Pilar, Algora del Valle, Carlos   +4 more
core   +7 more sources

Evaluation of the reliability of commercial concentrator triple-junction solar cells by means of accelerated life tests (ALT) [PDF]

AIP Conference Proceedings, 2013
A temperature accelerated life test on commercial concentrator lattice-matched GaInP/GaInAs/Ge triple-junction solar cells has been carried out. The solar cells have been tested at three different temperatures: 119, 126 and 164 °C and the nominal photo-current condition (820 X) has been emulated by injecting current in darkness.
Espinet González, Pilar, Algora del Valle, Carlos, Núñez Mendoza, Neftalí, Orlando Carrillo, Vincenzo, Vázquez López, Manuel, Bautista Villares, Jesus, Araki, Kenji   +6 more
core   +7 more sources

UJI HIDUP DIPERCEPAT PADA DISTRIBUSI EKSPONENSIAL TERSENSOR TIPE II DENGAN TEGANGAN KONSTAN [PDF]

Media Statistika, 2010
Accelerated Life Testing (ALT) is used to obtain information quickly on life distribution, failure rates and reliabilities. ALT is achieved by subjecting the test units to conditions such that the failure occur sooner. Prediction of long term reliability
Oktaviana Prayudhani, Triastuti Wuryandari   +1 more
doaj   +5 more sources

Preliminary temperature accelerated life test (ALT) on lattice mismatched triple-junction concentrator solar cells-on-carriers [PDF]

AIP Conference Proceedings, 2014
A temperature accelerated life test on concentrator lattice mismatched Ga0.37In0.63P/Ga0.83In0.17As/Ge triple-junction solar cells-on-carrier is being carried out. The solar cells have been tested at three different temperatures: 125, 145 and 165°C and the nominal photo-current condition (500X) is emulated by injecting current in darkness.
Orlando Carrillo, Vincenzo, Espinet González, Pilar, Núñez Mendoza, Neftalí, Eltermann, Fabian, Contreras, Yedileth, Bautista Villares, Jesus, Vázquez López, Manuel, Bett, Andreas W., Algora del Valle, Carlos   +8 more
openaire   +3 more sources

Case study in failure analysis of accelerated life tests (ALT) on III-V commercial triple-junction concentrator solar cells [PDF]

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 2013
In this work the failure analysis carried out in III-V concentrator multijunction solar cells after a temperature accelerated life test is presented. All the failures appeared have been catastrophic since all the solar cells turned into low shunt resistances.
Espinet González, Pilar, Romero, R., Orlando Carrillo, Vincenzo, Gabás, M., Núñez Mendoza, Neftalí, Vázquez López, Manuel, Palanco, S., Bijani, S., Contreras, Y., Galiana Blanco, Beatriz, Algora del Valle, Carlos, Araki, Kenji   +11 more
openaire   +3 more sources

Research on reliability of capacitors and transistors based on BP neural network and Icepak simulation [PDF]

Scientific Reports
Electronic components such as capacitors and transistors play critical roles in aerospace, military, and communication systems, where long-term reliability is essential.
Yi He, Xiaoqing Yang, Xiaoyu Zhai
doaj   +2 more sources

Preliminary temperature accelerated life test (ALT) on III-V commercial concentrator triple-junction solar cells

2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2, 2012
A quantitative temperature accelerated life test on sixty GaInP/GaInAs/Ge triple-junction commercial concentrator solar cells is being carried out. The final objective of this experiment is to evaluate the reliability, warranty period, and failure mechanism of high concentration solar cells in a moderate period of time.
Espinet González, Pilar, Algora del Valle, Carlos, Orlando Carrillo, Vincenzo, Núñez Mendoza, Neftalí, Vázquez López, Manuel, Bautista Villares, Jesus, Xiugang, He, Barrutia Poncela, Laura, Rey-Stolle Prado, Ignacio, Araki, Kenji   +9 more
openaire   +3 more sources

Failure analysis and improvement of tact switch in smart meter after accelerated life testing (ALT) [PDF]

International Conference on Optics, Electronics, and Communication Engineering (OECE 2024)
yong huang, xin jin, tianyu liu, weixin sun, min zhang, xingdong jing   +5 more
openaire   +2 more sources

Study on Intensifying the Fatigue of Mechanical Products: Examination of Household Refrigerator

Engineering Proceedings, 2023
To refine the fatigue lifespan of products such as automobiles, refrigerators, etc., parametric accelerated life testing (ALT), as a new method for ensuring structured reliability, put forward to assess designs by subjecting them to repeated loads.
Seongwoo Woo, Dennis L. O’Neal, Yimer Mohammed Hassen, Gezae Mebrahtu   +3 more
doaj   +1 more source

Reliability design of mechanical systems subjected to repetitive stresses [PDF]

MATEC Web of Conferences, 2021
To enhance the design of mechanical systems, parametric Accelerated Life Testing (ALT) as a systematic reliability method is proposed as a way to evaluate the design of mechanical systems subjected to repeated impact stresses.
Woo Seong-woo, O’Neal Dennis L., Hassen Yimer Mohammed   +2 more
doaj   +1 more source