Results 221 to 230 of about 36,992 (256)
Analysis of a pre‐stressed bi‐material accelerated‐life‐test (ALT) specimen
ZAMM - Journal of Applied Mathematics and Mechanics / Zeitschrift für Angewandte Mathematik und Mechanik, 2010 AbstractApplication of mechanical pre‐stressing could be an effective means for achieving a failure‐mode‐shift‐free “destructive ALT effect” in electronic and photonic devices and micro‐electro‐mechanical systems (MEMS). A simple, physically meaningful and easy‐to‐use analytical (“mathematical”) predictive model has been developed to assess the ...
E. Suhir
+5 more sources
Temperature accelerated life test (ALT) at the circuit board level
Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future', 2002 The purpose of ALT (Accelerated life test) lies in evaluating the failure rate of an item by obtaining expedient information on the lifetest distribution of a material or product by applying stress levels more severe than those specified by standard conditions, in order to greatly reduce the time needed to observe stress reactions or to magnify such ...
C.R. Yang, J.T. Kim
openaire +2 more sources
P‐66: Accelerated Life Test (ALT) Evaluation Method for Backlight LEDs
SID Symposium Digest of Technical Papers, 2012 Abstract A backlight light‐emitting diodes (LEDs) accelerated life test method can indicate that the life time of the 20.1“/55” backlight LEDs are about 24,000/67,000 hours under around 2,000 hours test time. The accelerated life test estimates LEDs lifetime in normal use by operating LEDs at high environmental stresses.
I‐Hsun Hsieh +4 more
openaire +2 more sources
2011 37th IEEE Photovoltaic Specialists Conference, 2011 Accelerated life testing (ALT) is a method of validating product reliability in a short time period of weeks or months through application of stresses much higher than a product would experience in ordinary operation. ALT can find dominant failure mechanisms and is often used when wear-out failure is involved.
Ron Vidano +3 more
openaire +2 more sources
Microelectronics Reliability, 2008 Abstract In this paper, to improve the reliability of InGaN white LED Backlight module, we have analyzed the module level accelerated life test (ALT) for LED which is used for the front display in the refrigerator. In addition, we have suggested a screen method that enables to screen out LEDs which have potential leakage problems.
Jae-Seong Jeong +2 more
openaire +2 more sources
Accelerated Life Testing (ALT) Design Based on Computational Reliability Analysis
Quality and Reliability Engineering International, 2015 Accelerated life testing (ALT) design is usually performed based on assumptions of life distributions, stress–life relationship, and empirical reliability models. Time‐dependent reliability analysis on the other hand seeks to predict product and system life distribution based on physics‐informed simulation models.
Zhen Hu, Sankaran Mahadevan
openaire +2 more sources
Journal of Electronic Packaging, 2002 Accelerated life tests (ALTs) are aimed at revealing and understanding the physics of the expected or occurred failures, i.e., are able to detect the possible failure modes and mechanisms. Another objective of the ALTs is to accumulate representative failure statistics.
E. Suhir
openaire +2 more sources
Case Studies of Parametric Accelerated Life Testing (ALT)
, 2023 Seongwoo Woo
openaire +2 more sources