Results 161 to 170 of about 38,954 (267)

XHEMTs on Ultrawide Bandgap Single‐Crystal AlN Substrates

open access: yesAdvanced Electronic Materials, Volume 12, Issue 3, 4 February 2026.
AlN/GaN/AlN XHEMTs [single‐crystal (“X‐tal”) high‐electron‐mobility transistors] are built on bulk AlN substrates with a 20 nm pseudomorphic GaN channel. This coherent epitaxial double heterostructure promises low‐defect, thermally efficient nitride electronics for next‐generation RF technology.
Eungkyun Kim   +6 more
wiley   +1 more source

The stacking fault annihilation in a-plane AlN during high-temperature annealing

open access: bronze, 2023
Xiaojuan Sun   +9 more
openalex   +2 more sources

Modeling and Measurement of Noise in Aluminium Nitride Piezoelectric MEMS

open access: yesAdvanced Electronic Materials, Volume 12, Issue 3, 4 February 2026.
This work analyzes electrical noise in piezoelectric AlN MEMS devices using a combined measurement‐modeling approach. The framework separates sample and amplifier noise contributions and demonstrates close agreement between model and experiment at both room and cryogenic temperatures.
Sina Zare Pakzad   +8 more
wiley   +1 more source

Phonons in Single‐Domain κ‐Ga2O3 Studied by Polarization Angle‐Resolved Raman Scattering

open access: yesAdvanced Electronic Materials, Volume 12, Issue 3, 4 February 2026.
Single‐domain κ‐Ga2O3 is systematically studied using advanced Raman spectroscopy, revealing over 100 Raman‐active phonon modes. These modes are compared with theoretical predictions and organized within a newly established nomenclature, offering a robust reference for future research.
Alwin Wüthrich   +11 more
wiley   +1 more source

Dual phase high temperature Si<sub>3</sub>N<sub>4</sub>/Al(Ti)N films with tunable thermal conductivity. [PDF]

open access: yesNat Commun
Gao Z   +9 more
europepmc   +1 more source

XHEMTs on Ultrawide Bandgap Single‐Crystal AlN Substrates (Adv. Electron. Mater. 3/2026)

open access: yesAdvanced Electronic Materials, Volume 12, Issue 3, 4 February 2026.
Single‐Crystal AlN Substrates In their Research Article (10.1002/aelm.202500393), Eungkyun Kim, Debdeep Jena, Huili Grace Xing, and co‐workers demonstrate single‐crystal high electron mobility transistors (XHEMTs) on bulk AlN substrates for the first time, delivering exceptional RF performance.
Eungkyun Kim   +6 more
wiley   +1 more source

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