Results 211 to 220 of about 12,032 (268)
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Transferred Electron Amplifiers
IEEE Journal of Solid-State Circuits, 1969The basic principles of operation of stable (non-oscillating) transferred electron amplifiers are reviewed with the aid of simple physical models.
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Measurement Techniques, 1966
Up-to-date electrometer tube amplifiers are a perfect equipment for measuring currents and voltages from sources with a large internal resistance, and they can be used for solving a wide range of problems related to electrometric measurements. The current sensitivity of mass-produced tube electrometers amounts to 10−15−10−14 A.
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Up-to-date electrometer tube amplifiers are a perfect equipment for measuring currents and voltages from sources with a large internal resistance, and they can be used for solving a wide range of problems related to electrometric measurements. The current sensitivity of mass-produced tube electrometers amounts to 10−15−10−14 A.
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Application of micro-electronics to IF amplifiers
IEEE Transactions on Vehicular Communications, 1965Integrated Circuit technology is reviewed by a survey of the characteristics of components available for both monolithic and hybrid construction. The component survey results in a list of guide lines to be used in designing linear integrated circuits; the guide lines are then employed to design a 60 mc IF amplifier.
J.J. Robertson, R.A. Hirschfeld
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Transferred Electron Amplifiers and Oscillators
IEEE Transactions on Microwave Theory and Techniques, 1970The current status of transferred electron devices (TEDs) is surveyed. The physics of the transferred electron effect, the theory of amplifiers and oscillators, material growth, device fabrication, and the design of amplifier and oscillator circuits are discussed along with a presentation of the outlook for the near future.
S.Y. Narayan, F. Sterzer
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A nondegenerate electron beam parametric amplifier
IRE Transactions on Electron Devices, 1961In a non-degenerate electron beam parametric amplifier (EBPA), signal and idler frequencies are far apart. This contrasts with the more familiar degenerate type which uses a pump frequency approximately equal to twice the signal frequency, thus placing the idler near the signal.
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Quasiballistic electronic transport in a tunneling hot-electron-transfer amplifier
Physical Review B, 1991Ce transport est simule en le traitant comme une diode a barriere double ou le champ a travers chaque barriere peut varier independemment. Le courant est evalue en calculant le coefficient de transmission de la structure entiere en partant d'un cadre de transport coherent, puis en introduisant une diffusion elastique et inelastique des electrons entre ...
, Leo, , Bending
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Phase variation in free-electron laser amplifiers
IEEE Journal of Quantum Electronics, 1987The evolution of the phase of the output radiation of free-electron laser amplifiers is investigated by means of a three-dimensional simulation code. The configuration employed consists of the propagation of a relativistic electron beam through a loss-free cylindrical waveguide in the presence of a helically symmetric wiggler and a uniform axial guide ...
Henry P. Freund, Achintya K. Ganguly
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Amplifiers before electronics — the Magnifiers
2008 IEEE History of Telecommunications Conference, 2008Amazing ingenuity was shown by dasiaelectricianspsila prior to the development of the thermionic valve (tube) into a reliable means of amplification of extremely low current signals in the earliest telecommunication systems. This paper classifies the devices used and then describes the principles involved in the group known as magnifiers.
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Hot Electron Transfer Amplifiers
1988The principles of operation of a hot electron transistor is presented. Device proposals and experimental results are reviewed.
Mordehai Heiblum, Marshall I. Nathan
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Performance of Operational Amplifiers With Electronic Mode Switching
IEEE Transactions on Electronic Computers, 1963The linear-circuit performance equation for an important class of mode-switched operational amplifiers is derived to identify errors caused by finite feedback loop gains, switch resistance, and follower-amplifier source impedance. Errors due to capacitor dielectric absorption, switching spikes, dc leakage, and current limiting are discussed with ...
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