Results 91 to 100 of about 116,969 (302)

An All‐Optical Driven Bio‐Photovoltaic Interface for Active Control of Live Cells

open access: yesAdvanced Functional Materials, EarlyView.
Bio‐photovoltaic Interface (BIO‐PV‐I) for live cell manipulation is presented. BIO‐PV‐I can be activated non‐invasively and remotely to control the spatial motility, adhesion, and morphology of cells adhering to it. BIO‐PV‐I uses a patterned light‐induced electric potential in iron‐doped lithium niobate crystals whose light‐driven and reversible nature,
Lisa Miccio   +8 more
wiley   +1 more source

Trap‐Modified Inverted Organic Photodetectors via Layer‐by‐Layer Processing with Poly(N‐vinylcarbazole) Additives

open access: yesAdvanced Functional Materials, EarlyView.
Trap state engineering in inverted organic photodetectors (OPDs) is achieved via combined layer‐by‐layer (LbL) processing and poly(N‐vinylcarbazole) (PVK) incorporation. LbL reduces the trap density while PVK additives gradually shift trap states from shallow band‐edge to deep mid‐gap levels, tailoring the energy distribution.
Jingwei Yi   +10 more
wiley   +1 more source

APPROACHES TO COUNTERING COUNTERFEIT PRODUCTION OF ANALOG INTEGRATED CIRCUITS

open access: yesБезопасность информационных технологий
The intensive development and adoption of Industry 4.0 technologies across various industrial sectors, coupled with the progressive digitalization of society, are driving increased consumption of a wide range of integrated circuits (ICs) and electronic ...
Sergey G. Mosin, Vitaly A. Telets
doaj   +1 more source

A Current Mode Design of Fractional Order Universal Filter

open access: yesAdvances in Electrical and Computer Engineering, 2019
In this paper, low-voltage active elements based a general filter topology, which provides fractional order low-pass, high-pass, band-pass and band-reject filter responses at the same circuit, is introduced.
SACU, I. E., ALCI, M.
doaj   +1 more source

Product assurance technology for custom LSI/VLSI electronics [PDF]

open access: yes
The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined ...
Blaes, B. R.   +8 more
core   +1 more source

DNA‐Templated 2D Heterostructures as Phototriggered Dynamic Nanohybrids: From Releasing Molecular Loads to Controlling Enzyme Biocatalytic Function

open access: yesAdvanced Functional Materials, EarlyView.
DNA strands are employed both as dynamic linkers and nanoscale templates for the integration of Ag2S nanoparticles on MoS2, which in turn imparted photothermal responsiveness; this feature permits the selective cargo (fluorophore, quantum dots or an enzyme) release from the MoS2 surface in response to local heat induced by light irradiation.
Kai Chen   +3 more
wiley   +1 more source

Analog Frequency Tracking Filter

open access: yesAdvances in Electrical and Computer Engineering, 2013
This paper propose a new type of analog adaptive filter derived as a generalization of the concept of matched filter. We conceive such a filter to track the instantaneous frequency of frequency modulated signals.
ISAR, A., ISAR, D.
doaj   +1 more source

Melt Grafting of Geometry‐Tailored Voltage Stabilizers for High‐Performance Polypropylene Insulation

open access: yesAdvanced Functional Materials, EarlyView.
A scalable one‐step melt grafting strategy is developed to enhance the dielectric properties of isotactic polypropylene by covalently incorporating thermally stable aromatic voltage stabilizers. This solvent‐free approach improves volume resistivity and DC breakdown strength through deep trap formation and charge localization, offering a sustainable ...
Nazirul Mubin bin Normansah   +9 more
wiley   +1 more source

Fault features analysis for soft faults of analog circuits with tolerance

open access: yesMATEC Web of Conferences, 2018
Soft faults of analog circuits are more difficult to diagnose than hard faults because the soft faults are caused by the deviations of component parameters. Node voltages were traditionally used as the testing signals to diagnose analog circuits.
Zhang Chaojie   +3 more
doaj   +1 more source

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