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A routing methodology for analog integrated circuits
1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers, 2002A general methodology for the design of the interconnections of analog circuits to meet high-level constraints on performance is described. In this approach, sensitivities of performance to parasitics are computed, and a set of bounding constraints for parasitics is determined.
Enrico Malavasi +2 more
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Analog Integrated Circuit Optimization
2020This chapter presents a novel telescopic operational transconductance amplifier (OTA) using the bulk-driven MOS technique. This circuit is optimized for ultra-low power applications such as biomedical devices. The proposed the bulk-driven fully differential telescopic OTA with very low threshold voltages is designed under ±0.9V supply voltage.
Houda Daoud +3 more
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Integrator Circuit as an Analogy for Convection
Nuclear Technology, 2007Thermal fluid physics associated with natural convection is investigated by using Rayleigh-Benard convection experiments and numerical simulations.
S. Usman +4 more
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Programmable analog integrated circuit
Proceedings Norchip Conference, 2004., 2005The protorype of a Programmable Analog Integrated Circuit (PAnIC) for use in remote laboratories is presented. The validity of using programmable analog integrated circuits to allow students to run remote experiments on different circuits is verified.
C. Wulff, R. Erstad, T. Ytterdal
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A Flexible Neural Analog Using Integrated Circuits
IEEE Transactions on Biomedical Engineering, 1970An electronic neural analog is described which contains variable absolute and relative refractory periods, two time constants, and separate control of the ``accommodation'' to sub-threshold voltage changes and the ``adaptation'' produced by the occurrence of output pulses (spikes).
A S, French, R B, Stein
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Detection of catastrophic faults in analog integrated circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1989The IC fabrication process contains several testing stages. Because of the high cost of packaging, the testing stage prior to aging, called wafer probe, is key in reducing the overall manufacturing cost. Typically in this stage, specification tests are performed.
Linda S. Milor, V. Visvanathan
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Optimization of shield structures in analog integrated circuits
Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03., 2003The effect of shield structures for local wirings of analog integrated circuits on crosstalk is determined by electromagnetic simulation. The crosstalk of parallel wirings is reduced to -70 dB by the shield above and between the wirings. The optimal shield structure and terminal-impedance dependence are determined by numerical analysis taking terminal ...
Ken Yamamoto +2 more
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Ultra-Low Voltage Analog Integrated Circuits
IEICE Transactions on Electronics, 2006The operation of analog circuits from ultra low supply voltages becomes necessary due to semiconductor technology scaling. Yet traditional design techniques cannot be used. In this paper, we review techniques that allow analog circuits to operate with supply voltages as low as 0.5 V.
Shouri Chatterjee +2 more
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Analog Integrated-Circuit Blocks
1997A typical analog integrated circuit is composed of several pieces of circuitry, each of which performs a specific circuit function contributing to the overall operation of the circuit. These basic circuit building blocks are common to a large variety of analog circuits and it is convenient to consider them individually.
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Testing of Analog Integrated Circuits
1991The broad aim of an integrated circuit (IC) designer working on a specific product is to provide certain functionality at minimum cost. In practice this translates into many specific goals. Some of these goals, as, for example, the optimization of certain performance measures or the minimization of chip area, are well supported by computer tools for ...
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