Results 61 to 70 of about 116,969 (302)

Symbolic analysis tools-the state of the art [PDF]

open access: yes, 1996
This paper reviews the main last generation symbolic analyzers, comparing them in terms of functionality, pointing out also their shortcomings.
Fernández Fernández, Francisco Vidal   +1 more
core   +1 more source

Electrical Conductivities of Conductors, Semiconductors, and Their Mixtures at Elevated Temperatures

open access: yesAdvanced Engineering Materials, EarlyView.
This article presents a comprehensive review of temperature‐dependent electrical conductivity data for multiple material classes at elevated temperatures, highlighting a persistent conductivity gap between metals and semiconductors in the range of 102$\left(10\right)^{2}$– 107$\left(10\right)^{7}$ S/m. Metal–ceramic irregular metamaterials are proposed
Valentina Torres Nieto, Marcia A. Cooper
wiley   +1 more source

Ultra-Low Voltage Analog IC Design: Challenges, Methods and Examples [PDF]

open access: yesRadioengineering, 2018
The paper brings an overview of main challenges and design techniques effectively applicable for ultra-low voltage analog integrated circuits in nanoscale technologies.
V. Stopjakova   +6 more
doaj  

Analog VLSI-Based Modeling of the Primate Oculomotor System [PDF]

open access: yes, 1998
One way to understand a neurobiological system is by building a simulacrum that replicates its behavior in real time using similar constraints. Analog very large-scale integrated (VLSI) electronic circuit technology provides such an enabling technology ...
Horiuchi, Timothy K., Koch, Christof
core   +3 more sources

Enhanced Strength and Corrosion Resistance of Ti‐13Nb‐12Ta‐10Zr‐4Sn Alloy by Aging Treatment

open access: yesAdvanced Engineering Materials, EarlyView.
This work systematically investigates the effect of aging treatment on mechanical properties and corrosion behavior of vacuum arc‐melted Ti‐13Nb‐12Ta‐10Zr‐4Sn alloy. Owing to the increased α″ martensite, strength and corrosion resistance were significantly enhanced by aging treatment.
Yuhua Li   +5 more
wiley   +1 more source

Exploring Dipolar Dynamics and Ionic Transport in Metal‐Organic Frameworks: Experimental and Theoretical Insights

open access: yesAdvanced Functional Materials, EarlyView.
In this study, the interplay of dipolar dynamics and ionic charge transport in MOF compounds is investigated. Synthesizing the novel structure CFA‐25 with integrated freely rotating dipolar groups, local and macroscopic effects, including interactions with Cs cations are explored.
Ralph Freund   +6 more
wiley   +1 more source

Ultra-low-power CMOS ring oscillator with minimum power consumption of 2.9 pW using low-voltage biasing technique

open access: yesOpen Engineering
The need for low-power low-voltage circuit so lutions increases significantly with the rapid spread of wireless sensor network (WSN) and energy harvesting applications.
Al-Shebanee Durgham
doaj   +1 more source

Automatic synthesis of analog layout : a survey [PDF]

open access: yes, 1990
A review of recent research in the automatic synthesis of physical geometry for analog integrated circuits is presented. On introduction, an explanation of the difficulties involved in analog layout as opposed to digital layout is covered.
Rentmeesters, Mark J.
core  

NanoMOF‐Based Multilevel Anti‐Counterfeiting by a Combination of Visible and Invisible Photoluminescence and Conductivity

open access: yesAdvanced Functional Materials, EarlyView.
This study presents novel anti‐counterfeiting tags with multilevel security features that utilize additional disguise features. They combine luminescent nanosized Ln‐MOFs with conductive polymers to multifunctional mixed‐matrix membranes and powder composites. The materials exhibit visible/NIR emission and matrix‐based conductivity even as black bodies.
Moritz Maxeiner   +9 more
wiley   +1 more source

Mixed-Signal Testability Analysis for Data-Converter IPs [PDF]

open access: yes, 2005
In this paper, a new procedure to derive testability measures is presented. Digital testability can be calculated by means of probability, while in analog it is possible to calculate testability using impedance values. Although attempts have been made to
Kerkhoff, Hans G., Kraats, Araldo van de
core   +2 more sources

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