Results 21 to 30 of about 5,582 (252)
Point-by-point compositional analysis for atom probe tomography
MethodsX, 2014 This new alternate approach to data processing for analyses that traditionally employed grid-based counting methods is necessary because it removes a user-imposed coordinate system that not only limits an analysis but also may introduce errors.
Leigh T. Stephenson +7 more
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On strong-scaling and open-source tools for analyzing atom probe tomography data
npj Computational Materials, 2021 The development of strong-scaling computational tools for high-throughput methods with an open-source code and transparent metadata standards has successfully transformed many computational materials science communities.
Markus Kühbach +5 more
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Atom Probe Tomography for Catalysis Applications: A Review
Applied Sciences, 2019 Atom probe tomography is a well-established analytical instrument for imaging the 3D structure and composition of materials with high mass resolution, sub-nanometer spatial resolution and ppm elemental sensitivity.
Cédric Barroo +2 more
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Synergistic Effect of Alloying on the Strength and Ductility of High Carbon Pearlitic Steel
Metals, 2023 In this work, the effects of the micro-alloying of Mn, Ni, and Si on the microstructure and mechanical properties of high-carbon pearlite steels were investigated.
Na Min +6 more
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Reflections on the Projection of Ions in Atom Probe Tomography [PDF]
Microscopy and Microanalysis, 2017 AbstractThere are two main projections used to transform, and reconstruct, field ion micrographs or atom probe tomography data into atomic coordinates at the specimen surface and, subsequently, in three dimensions. In this article, we present a perspective on the strength of the azimuthal equidistant projection in comparison with the more widely used ...
Frédéric De Geuser, Baptiste Gault
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Three‐Dimensional Atomic‐Scale Tomography of Buried Semiconductor Heterointerfaces
Advanced Materials Interfaces, 2023 Atom probes generate three‐dimensional atomic‐scale tomographies of material volumes corresponding to the size of modern‐day solid‐state devices. Here, the capabilities of atom probe tomography are evaluated to analyze buried interfaces in semiconductor ...
Sebastian Koelling +4 more
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Estimation of the Reconstruction Parameters for Atom Probe Tomography [PDF]
Microscopy and Microanalysis, 2008 The application of wide field-of-view detection systems to atom probe experiments emphasizes the importance of careful parameter selection in the tomographic reconstruction of the analyzed volume, as the sensitivity to errors rises steeply with increases in analysis dimensions.
Gault, B +5 more
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Electrochemistry Communications, 2019 The electrodeposition of copper in the presence of a magnetic field has previously been shown to affect both electrochemical processes and the microstructure.
Denise Yin +4 more
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Atom probe tomography in nanoelectronics [PDF]
The European Physical Journal Applied Physics, 2014 The role of laser assisted atom probe tomography (APT) in microelectronics is discussed on the basis of various illustrations related to SiGe epitaxial layers, bipolar transistors or MOS nano-devices including gate all around (GAA) devices that were carried out at the Groupe de Physique des Matériaux of Rouen (France). 3D maps as provided by APT reveal
Blavette, Didier, Duguay, Sébastien
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Review of Scientific Instruments, 2007 The technique of atom probe tomography (APT) is reviewed with an emphasis on illustrating what is possible with the technique both now and in the future. APT delivers the highest spatial resolution (sub-0.3-nm) three-dimensional compositional information of any microscopy technique.
Thomas F. Kelly, Michael K. Miller
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