Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy [PDF]
, 2009 In this work, the authors report on a quantitative investigation of lateral-force gradient and lateral force between a tungsten tip and Si(111)-(7×7) surface using combined noncontact lateral-force microscopy and scanning tunneling microscopy ...
Atabak, Mehrdad +5 more
core +3 more sources
Imaging of the Hydrogen Subsurface Site in Rutile TiO2 [PDF]
, 2009 From an interplay between simultaneously recorded noncontact atomic force microscopy and scanning tunneling microscopy images and simulations based on density functional theory, we reveal the location of single hydrogen species in the surface and ...
Besenbacher, Flemming +7 more
core +1 more source
Chemical Phenomena of Atomic Force Microscopy Scanning [PDF]
Analytical Chemistry, 2018 Atomic force microscopy is widely used for nanoscale characterization of materials by scientists worldwide. The long-held belief of ambient AFM is that the tip is generally chemically inert but can be functionalized with respect to the studied sample.
Anton V. Ievlev +8 more
openaire +4 more sources
Statistical Study of the Corrosion Behavior of Al2CuMg Intermetallics in AA2024-T351 by SKPFM [PDF]
, 2008 A statistical study combining atomic force microscopy, scanning Kelvin probe force microscopy (SKPFM), and energy-dispersive spectroscopy was carried out on more than 300 Al2CuMg intermetallic particles of AA2024 alloy to determine their corrosion ...
Blanc, Christine +3 more
core +3 more sources
Local spectroscopy and atomic imaging of tunneling current, forces and dissipation on graphite [PDF]
, 2005 Theory predicts that the currents in scanning tunneling microscopy (STM) and the attractive forces measured in atomic force microscopy (AFM) are directly related. Atomic images obtained in an attractive AFM mode should therefore be redundant because they
C. F. Quate +7 more
core +2 more sources
Scanning speed phenomenon in contact-resonance atomic force microscopy
Beilstein Journal of Nanotechnology, 2018 This work presents data confirming the existence of a scan speed related phenomenon in contact-mode atomic force microscopy (AFM). Specifically, contact-resonance spectroscopy is used to interrogate this phenomenon.
Christopher C. Glover +2 more
doaj +1 more source
A scanning force microscopy study on the morphology of elastomer-coagent blends [PDF]
, 1993 Atomic force scanning microscopy (AFM) was used to investigate the dispersion of low molecular weight compounds in ethylene-propylene copolymers (EPM). Where other microscopical techniques failed to provide morphological details of this type of blend, as
Bantjes, A. +4 more
core +4 more sources
Development and AFM study of porous scaffolds for wound healing applications [PDF]
, 2004 An engineering approach to the development of biomaterials for promotion of wound healing emphasises the importance of a well-controlled architecture and concentrates on optimisation of morphology and surface chemistry to stimulate guidance of the ...
Bowen, W.R. +4 more
core +2 more sources
AIP Advances, 2019 Atomic force microscopy (AFM) was combined with scanning electron microscopy (SEM) to investigate electronic devices. In general, under observation using an optical microscope, it is difficult to position the cantilever at an arbitrary scan area of an ...
Takeshi Uruma +6 more
doaj +1 more source
In situ microscopic investigation of ion migration on the surface of chromium coated steels
npj Materials Degradation, 2022 Cathodic spreading of electrolyte on two-layers chromium coatings electrodeposited from trivalent chromium electrolyte on steel was studied on the micro- and the macroscale. The behavior is discussed in view of results obtained on electrical conductivity
J. Manoj Prabhakar +2 more
doaj +1 more source