Dual-heterodyne Kelvin probe force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2023 We present a new open-loop implementation of Kelvin probe force microscopy (KPFM) that provides access to the Fourier spectrum of the time-periodic surface electrostatic potential generated under optical (or electrical) pumping with an atomic force ...
Benjamin Grévin +3 more
doaj +5 more sources
Visualization of π-hole in molecules by means of Kelvin probe force microscopy [PDF]
Nature Communications, 2023 Submolecular charge distribution significantly affects the physical-chemical properties of molecules and their mutual interaction. One example is the presence of a π-electron-deficient cavity in halogen-substituted polyaromatic hydrocarbon compounds, the
B. Mallada +7 more
doaj +4 more sources
Kelvin probe force microscopy in liquid using electrochemical force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2015 Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid–gas interface.
Liam Collins +6 more
doaj +7 more sources
Artifacts in time-resolved Kelvin probe force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2018 Kelvin probe force microscopy (KPFM) has been used for the characterization of metals, insulators, and semiconducting materials on the nanometer scale. Especially in semiconductors, the charge dynamics are of high interest.
Sascha Sadewasser +2 more
doaj +5 more sources
High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method [PDF]
Data in Brief, 2020 This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface.
Young Min Park +3 more
doaj +2 more sources
Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2022 Surface photovoltage (SPV) measurements are a crucial way of investigating optoelectronic and photocatalytic semiconductors. The local SPV is generally measured consecutively by Kelvin probe force microscopy (KPFM) in darkness and under illumination, in ...
Masato Miyazaki +2 more
doaj +2 more sources
Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode [PDF]
Beilstein Journal of Nanotechnology, 2021 The open-loop (OL) variant of Kelvin probe force microscopy (KPFM) provides access to the voltage response of the electrostatic interaction between a conductive atomic force microscopy (AFM) probe and the investigated sample. The measured response can be
Gheorghe Stan, Pradeep Namboodiri
doaj +2 more sources
High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy [PDF]
Nature Communications, 2023 Unraveling local dynamic charge processes is vital for progress in diverse fields, from microelectronics to energy storage. This relies on the ability to map charge carrier motion across multiple length- and timescales and understanding how these ...
Marti Checa +14 more
doaj +2 more sources
Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2020 Kelvin probe force microscopy is a scanning probe technique used to quantify the local electrostatic potential of a surface. In common implementations, the bias voltage between the tip and the sample is modulated.
Christian Ritz +2 more
doaj +2 more sources
Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy [PDF]
Light: Science & Applications, 2021 Organic–inorganic halide perovskites are emerging materials for photovoltaic applications with certified power conversion efficiencies (PCEs) over 25%.
Ting-Xiao Qin +7 more
doaj +2 more sources