Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy [PDF]
Nanoscale Research Letters, 2018 Graphene oxide (GO) films were formed by drop-casting method and were studied by FTIR spectroscopy, micro-Raman spectroscopy (mRS), X-ray photoelectron spectroscopy (XPS), four-points probe method, atomic force microscopy (AFM), and scanning Kelvin probe
Oleksandr M. Slobodian +7 more
doaj +2 more sources
Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices [PDF]
Beilstein Journal of Nanotechnology, 2018 In this study we investigate the influence of the operation method in Kelvin probe force microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film ...
Amelie Axt +4 more
doaj +2 more sources
Numerical analysis of single-point spectroscopy curves used in photo-carrier dynamics measurements by Kelvin probe force microscopy under frequency-modulated excitation [PDF]
Beilstein Journal of Nanotechnology, 2018 In recent years, the investigation of the complex interplay between the nanostructure and photo-transport mechanisms has become of crucial importance for the development of many emerging photovoltaic technologies.
Pablo A. Fernández Garrillo +2 more
doaj +2 more sources
AC Kelvin Probe Force Microscopy Enables Charge Mapping in Water. [PDF]
ACS Nano, 2022 Mapping charged chemical groups at the solid-liquid interface is important in many areas, ranging from colloidal systems to biomolecular interactions.
Hackl T, Schitter G, Mesquida P.
europepmc +3 more sources
The influence of surface topography on Kelvin probe force microscopy
Nanotechnology, 2009 Long-range electrostatic forces govern the imaging mechanism in electrostatic force microscopy as well as in Kelvin probe force microscopy. To improve the analysis of such images, simulations of the electrostatic field distribution have been performed in the past using a flat surface and a cone-shaped tip.
S, Sadewasser +3 more
core +4 more sources
Pulsed Force Kelvin Probe Force Microscopy-A New Type of Kelvin Probe Force Microscopy under Ambient Conditions. [PDF]
J Phys Chem C Nanomater InterfacesKelvin probe force microscopy (KPFM) is an increasingly popular scanning probe microscopy technique used for nanoscale imaging of surface potential for various materials, such as metals, semiconductors, biological samples, and photovoltaics, to reveal their surface work function and/or local accumulation of charges.
Zahmatkeshsaredorahi A, Jakob DS, Xu XG.
europepmc +3 more sources
In situ microscopic investigation of ion migration on the surface of chromium coated steels
npj Materials Degradation, 2022 Cathodic spreading of electrolyte on two-layers chromium coatings electrodeposited from trivalent chromium electrolyte on steel was studied on the micro- and the macroscale. The behavior is discussed in view of results obtained on electrical conductivity
J. Manoj Prabhakar +2 more
doaj +1 more source
High–low Kelvin probe force spectroscopy for measuring the interface state density
Beilstein Journal of Nanotechnology, 2023 The recently proposed high–low Kelvin probe force microscopy (KPFM) enables evaluation of the effects of semiconductor interface states with high spatial resolution using high and low AC bias frequencies compared with the cutoff frequency of the carrier ...
Ryo Izumi +3 more
doaj +1 more source
Atomic force microscopy in energetic materials research: A review
Energetic Materials Frontiers, 2022 Modern trends in the development of energetic materials include the various methods of particle surface modification and the widespread use of nanosized powders.
Ekaterina K. Kosareva +2 more
doaj +1 more source
Peak Force Infrared–Kelvin Probe Force Microscopy
Angewandte Chemie, 2020 AbstractCorrelative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provide insight into the structure–function relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution is a challenge.
Devon S. Jakob +5 more
openaire +4 more sources