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The role of the cantilever in Kelvin probe force microscopy measurements
Beilstein Journal of Nanotechnology, 2011 The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever.
Thilo Glatzel, Ernst Meyer, Amir Boag
exaly +3 more sources
Kelvin probe force microscopy in liquid using electrochemical force microscopy
Beilstein Journal of Nanotechnology, 2015 Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid–gas interface.
Liam Collins +6 more
doaj +3 more sources
AIP Advances, 2013 The resistive switching characteristics of TiO2 thin films were investigated using conductive atomic force microscopy (CAFM) and Kelvin probe force microscopy (KPFM).
Yuanmin Du +6 more
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Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices
Beilstein Journal of Nanotechnology, 2018 In this study we investigate the influence of the operation method in Kelvin probe force microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film ...
Amélie Axt +2 more
exaly +2 more sources
Dual-heterodyne Kelvin probe force microscopy
Beilstein Journal of Nanotechnology, 2023 We present a new open-loop implementation of Kelvin probe force microscopy (KPFM) that provides access to the Fourier spectrum of the time-periodic surface electrostatic potential generated under optical (or electrical) pumping with an atomic force ...
Benjamin Grévin +3 more
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Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy
Beilstein Journal of Nanotechnology, 2022 Surface photovoltage (SPV) measurements are a crucial way of investigating optoelectronic and photocatalytic semiconductors. The local SPV is generally measured consecutively by Kelvin probe force microscopy (KPFM) in darkness and under illumination, in ...
Masato Miyazaki +2 more
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Beilstein Journal of Nanotechnology, 2023 In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination.
Zeinab Eftekhari +8 more
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Data in Brief, 2020 This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface.
Young Min Park +3 more
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Revealing of InP multi-layer stacks from KPFM measurements in the dark and under illumination
EPJ Photovoltaics, 2022 Solar cells are complex devices, being constituted of many layers and interfaces. The study and the comprehension of the mechanisms that take place at the interfaces is crucial for efficiency improvement. This paper applies Kelvin probe force microscopy (
da Lisca Mattia +6 more
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Compensating for artifacts in scanning near-field optical microscopy due to electrostatics
APL Photonics, 2021 Nanotechnology and modern materials science demand reliable local probing techniques on the nanoscopic length scale. Most commonly, scanning probe microscopy methods are applied in numerous variants and shades, for probing the different sample properties.
Tobias Nörenberg +4 more
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