Results 1 to 10 of about 3,384,291 (161)

The role of the cantilever in Kelvin probe force microscopy measurements

Beilstein Journal of Nanotechnology, 2011
The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever.
George Elias, Thilo Glatzel, Ernst Meyer, Alex Schwarzman, Amir Boag, Yossi Rosenwaks   +5 more
doaj   +3 more sources

Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

Beilstein Journal of Nanotechnology, 2018
In this study we investigate the influence of the operation method in Kelvin probe force microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film ...
Amelie Axt, Ilka M. Hermes, Victor W. Bergmann, Niklas Tausendpfund, Stefan A. L. Weber   +4 more
doaj   +2 more sources

Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

Beilstein Journal of Nanotechnology, 2022
Surface photovoltage (SPV) measurements are a crucial way of investigating optoelectronic and photocatalytic semiconductors. The local SPV is generally measured consecutively by Kelvin probe force microscopy (KPFM) in darkness and under illumination, in ...
Masato Miyazaki, Yasuhiro Sugawara, Yan Jun Li   +2 more
doaj   +1 more source

Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination

Beilstein Journal of Nanotechnology, 2023
In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination.
Zeinab Eftekhari, Nasim Rezaei, Hidde Stokkel, Jian-Yao Zheng, Andrea Cerreta, Ilka Hermes, Minh Nguyen, Guus Rijnders, Rebecca Saive   +8 more
doaj   +1 more source

High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method

Data in Brief, 2020
This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface.
Young Min Park, Joon Sik Park, Choong-Heui Chung, Sangyeob Lee   +3 more
doaj   +1 more source

Revealing of InP multi-layer stacks from KPFM measurements in the dark and under illumination

EPJ Photovoltaics, 2022
Solar cells are complex devices, being constituted of many layers and interfaces. The study and the comprehension of the mechanisms that take place at the interfaces is crucial for efficiency improvement. This paper applies Kelvin probe force microscopy (
da Lisca Mattia, Connolly James P., Alvarez José, Mekhazni Karim, Vaissiere Nicolas, Decobert Jean, Kleider Jean-Paul   +6 more
doaj   +1 more source

Compensating for artifacts in scanning near-field optical microscopy due to electrostatics

APL Photonics, 2021
Nanotechnology and modern materials science demand reliable local probing techniques on the nanoscopic length scale. Most commonly, scanning probe microscopy methods are applied in numerous variants and shades, for probing the different sample properties.
Tobias Nörenberg, Lukas Wehmeier, Denny Lang, Susanne C. Kehr, Lukas M. Eng   +4 more
doaj   +1 more source

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

Beilstein Journal of Nanotechnology, 2021
The open-loop (OL) variant of Kelvin probe force microscopy (KPFM) provides access to the voltage response of the electrostatic interaction between a conductive atomic force microscopy (AFM) probe and the investigated sample. The measured response can be
Gheorghe Stan, Pradeep Namboodiri
doaj   +1 more source

Implementation of data-cube pump–probe KPFM on organic solar cells

Beilstein Journal of Nanotechnology, 2020
An implementation of pump–probe Kelvin probe force microscopy (pp-KPFM) is reported that enables recording the time-resolved surface potential in single-point mode or over a 2D grid. The spectroscopic data are acquired in open z-loop configuration, which
Benjamin Grévin, Olivier Bardagot, Renaud Demadrille   +2 more
doaj   +1 more source

Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications

Applied Microscopy, 2021
Neuromorphic systems require integrated structures with high-density memory and selector devices to avoid interference and recognition errors between neighboring memory cells. To improve the performance of a selector device, it is important to understand
Young-Min Kim, Jihye Lee, Deok-Jin Jeon, Si-Eun Oh, Jong-Souk Yeo   +4 more
doaj   +1 more source