Results 41 to 50 of about 3,384,291 (161)
Few binding events are here shown to elicit an extended work function change in a large‐area Au‐surface biofunctionalized with ≈108 capturing antibodies.
Cinzia Di Franco +6 more
doaj +1 more source
Control of bilayer polyelectrolyte coating parameters using the Kelvin probe microscopy [PDF]
В работе исследовалось бислойное покрытие полиэтиленимин/глюкозооксидаза на поверхности Si/SiO2 методом Кельвин-зонд силовой микроскопии (КЗСМ). При помощи КЗСМ удалось определить влияние освещения и типа проводимости Si на количество адсорбированных ...
Kozlowski, A. V. +3 more
core
Quantitative comparison of closed-loop and dual harmonic Kelvin probe force microscopy techniques [PDF]
Kelvin probe force microscopy (KPFM) is a widely used technique to map surface potentials at the nanometer scale. In traditional KPFM, a feedback loop regulates the DC bias applied between a sharp conductive probe and a sample to nullify the ...
Weber, Stefan A. L. +11 more
core +1 more source
MOVPE-Grown Quantum Cascade Laser Structures Studied by Kelvin Probe Force Microscopy
A technique for direct study of the distribution of the applied voltage within a quantum cascade laser (QCL) has been developed. The detailed profile of the potential in the laser claddings and laser core region has been obtained by gradient scanning ...
Konstantin Ladutenko +3 more
doaj +1 more source
AFM tip characterization by Kelvin probe force microscopy [PDF]
Reliable determination of the surface potential with spatial resolution is key for understanding complex interfaces that range from nanostructured surfaces to molecular systems to biological membranes. In this context, Kelvin probe force microscopy (KPFM)
A S Foster +17 more
core +2 more sources
Many surface processes of clay minerals require in-depth understanding of their surface electrical properties, such as surface charge density, surface potential distribution, etc In this paper, electrostatic force microscopy (EFM) and Kelvin probe force ...
Zonghua Qin +6 more
doaj +1 more source
High–low Kelvin probe force spectroscopy for measuring the interface state density
The recently proposed high–low Kelvin probe force microscopy (KPFM) enables evaluation of the effects of semiconductor interface states with high spatial resolution using high and low AC bias frequencies compared with the cutoff frequency of the carrier ...
Ryo Izumi +3 more
doaj +1 more source
In this work, methylammonium lead tribromide (MAPbBr3) single crystals are studied by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM).
Yann Almadori +4 more
doaj +1 more source
Nanoscale photovoltage mapping in CZTSe/CuxSe heterostructure by using kelvin probe force microscopy
In the present work, kelvin probe force microscopy (KPFM) technique has been used to study the CZTSe/Cu _x Se bilayer interface prepared by multi-step deposition and selenization process of metal precursors.
Manoj Vishwakarma +4 more
doaj +1 more source
Quantitative Kelvin probe force microscopy of current-carrying devices [PDF]
Kelvin probe force microscopy (KPFM) should be a key tool for characterizing the device physics of nanoscale electronics because it can directly image electrostatic potentials.
Gomez, Jose R +16 more
core +1 more source

