Results 51 to 60 of about 3,099 (255)

Piezoelectric Surface Charge and Dynamic Stimulation Synergize to Promote Cardiac Myoblast Alignment and Maturation

Advanced Healthcare Materials, EarlyView.
Surface polarization of PVDF films combined with mechanical stimulation generates piezoelectric electrical cues that modulate cardiomyoblast behaviour. Non‐poled and poled PVDF substrates provide distinct electroactive microenvironments influencing cell adhesion, proliferation, and differentiation.
Rafaela M Meira, Sylvie Ribeiro, Senentxu Lanceros‐Mendez, Clarisse Ribeiro   +3 more
wiley   +1 more source

Nanoscale photovoltage mapping in CZTSe/CuxSe heterostructure by using kelvin probe force microscopy

Materials Research Express, 2020
In the present work, kelvin probe force microscopy (KPFM) technique has been used to study the CZTSe/Cu _x Se bilayer interface prepared by multi-step deposition and selenization process of metal precursors.
Manoj Vishwakarma, Deepak Varandani, Mylene Hendrickx, Joke Hadermann, B R Mehta   +4 more
doaj   +1 more source

On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex

, 2018
In this work we analyzed the effect of the atomic force microscopy probe tip apex shape on Kelvin Probe Force Microscopy (KPFM) potential sensitivity and spatial resolution.
Keith J. Stevenson, Sergey Y. Luchkin
core   +1 more source

DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe Force Microscopy

, 2022
This paper presents the development of a novel Atomic Force Microscopy mode, enabling dc-bias-free surface potential measurements with high spatial resolution.
Poik, Mathias, Hackl, Thomas, Schitter, Georg; orcid:   +2 more
core   +1 more source

Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides [PDF]

, 2021
We report on a quantitative use of Kelvin probe force microscopy (KPFM) for the analysis of charge injection in thin oxides. Here, thin dielectrics are investigated through an atomic force microscopy tip that is used as a movable (virtual) top-electrode.
Kim, M., Serron, J., Celano, U.; id_orcid, Park, S., Lee, J., Lee, Y., Franco, J., Kim, J., van der Heide, P., Ryu, K., Smith, C., Celano, U.   +11 more
core   +1 more source

Ferroelectric Quantum Dots for Retinomorphic In‐Sensor Computing

Advanced Materials, EarlyView.
This work has provided a protocol for fabricating retinomorphic phototransistors by integrating ferroelectric ligands with quantum dots. The resulting device combines ferroelectricity, optical responsiveness, and low‐power operation to enable adaptive signal amplification and high recognition accuracy under low‐light conditions, while supporting ...
Tingyu Long, Huanyu Zhou, Jaewan Ko, Hongwei Tan, Jaemin Lim, Yanfei Zhao, Daehan Kang, Eojin Yoon, Gyeong‐Tak Go, Somin Kim, Seung‐Woo Lee, Chan‐Yul Park, Hyojun Choi, Hyeran Kim, Hyung Joong Yun, Sung Hyuk Park, Kwan Sik Park, Jeong Woo Park, Mungeun Kim, Yong Soo Cho, Ho Won Jang, Wenqiang Yang, Min Hyuk Park, Wan Ki Bae, Sebastiaan van Dijken, Joona Bang, Tae‐Woo Lee   +26 more
wiley   +1 more source

Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals

Beilstein Journal of Nanotechnology, 2018
In this work, methylammonium lead tribromide (MAPbBr3) single crystals are studied by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM).
Yann Almadori, David Moerman, Jaume Llacer Martinez, Philippe Leclère, Benjamin Grévin   +4 more
doaj   +1 more source

Stress analysis in semiconductor devices by Kelvin probe force microscopy

, 2022
The determination of built-in strain in semiconductor devices with nanometer spatial resolution and high sensitivity is needed for the characterization of nanoscale electronic devices.
Paul, S., Fuchs, F., Vogel, D., Rodriguez, P., Zahn, Dietrich R.T., Reuter, Danny, Sheremet, E., Geßner, Thomas, Haas, S., Zienert, Andreas, Hietschold, M., Schuster, Jörg   +11 more
core  

Kelvin Probe Force Microscopy in Bionanotechnology: Current Advances and Future Perspectives

Advanced Materials, EarlyView.
Kelvin probe force microscopy (KPFM) enables the nanoscale mapping of electrostatic surface potentials. While widely applied in materials science, its use in biological systems remains emerging. This review presents recent advances in KPFM applied to biological samples and provides a critical perspective on current limitations and future directions for
Ehsan Rahimi, Mario Palacios‐Corella, Arjan Mol, Salvador Pané, Josep Puigmartí‐Luis   +4 more
wiley   +1 more source

Probing the surface electrical properties of clay minerals with electrostatic force microscopy and kelvin probe force microscopy

Materials Research Express
Many surface processes of clay minerals require in-depth understanding of their surface electrical properties, such as surface charge density, surface potential distribution, etc In this paper, electrostatic force microscopy (EFM) and Kelvin probe force ...
Zonghua Qin, Xin Nie, Wenbin Yu, Shuguang Yang, Zongke Zhou, Shuqin Yang, Quan Wan   +6 more
doaj   +1 more source