Results 51 to 60 of about 3,384,291 (161)

Electrical Response of Different Crystalline Microregions in Poly(vinylidene fluoride)

Nanomaterials
The crystal structure has a great influence on the dielectric and piezoelectric performance of poly(vinylidene fluoride) (PVDF). In this work, we prepared PVDF films with two typical crystalline phases (α and β).
Mengyue Su, Jun Zhou, Yuqing Chen, Yilong Wang, Gan Jin, Haiyang Wang, Jiacheng Zhou, Xiaoyue Pang, Zepeng Lv, Kai Wu   +9 more
doaj   +1 more source

Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere

Beilstein Journal of Nanotechnology, 2019
This study deals with the preparation and characterization of metallic nanoinclusions on the surface of semiconducting Bi2Se3 that could be used for an enhancement of the efficiency of thermoelectric materials.
Petr Knotek, Tomáš Plecháček, Jan Smolík, Petr Kutálek, Filip Dvořák, Milan Vlček, Jiří Navrátil, Čestmír Drašar   +7 more
doaj   +1 more source

Measurement of polarization effects in dual-phase ceria-based oxygen permeation membranes using Kelvin probe force microscopy

Beilstein Journal of Nanotechnology, 2021
In this study, a dual phase composite (CSO-FC2O) consisting of 60 vol % Ce0.8Sm0.2O1.9 as oxygen-conductive phase and 40 vol % FeCo2O4 as electron-conductive phase was synthesized.
Kerstin Neuhaus, Christina Schmidt, Liudmila Fischer, Wilhelm Albert Meulenberg, Ke Ran, Joachim Mayer, Stefan Baumann   +6 more
doaj   +1 more source

Fractal Nature of Metallic and Insulating Domain Configurations in a VO2 Thin Film Revealed by Kelvin Probe Force Microscopy

, 2021
We investigated the surface work function (W-S) and its spatial distribution for epitaxial VO2/TiO2 thin films using Kelvin probe force microscopy (KPFM).
김동욱
core   +1 more source

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

Beilstein Journal of Nanotechnology, 2011
Surfaces of thin oxide films were investigated by means of a dual mode NC-AFM/STM. Apart from imaging the surface termination by NC-AFM with atomic resolution, point defects in magnesium oxide on Ag(001) and line defects in aluminum oxide on NiAl(110 ...
Thomas König, Georg H. Simon, Lars Heinke, Leonid Lichtenstein, Markus Heyde   +4 more
doaj   +1 more source

Routes to rupture and folding of graphene on rough 6H-SiC(0001) and their identification

Beilstein Journal of Nanotechnology, 2013
Twisted few layer graphene (FLG) is highly attractive from an application point of view, due to its extraordinary electronic properties. In order to study its properties, we demonstrate and discuss three different routes to in situ create and identify ...
M. Temmen, O. Ochedowski, B. Kleine Bussmann, M. Schleberger, M. Reichling, T. R. J. Bollmann   +5 more
doaj   +1 more source

Ohmic-to-Schottky Modification of Zno-Metal Contact Modulated by Film Thickness [PDF]

Materials Research
This work investigated the charge transport behavior at the interface between a Pt-Ir metal contact and transparent zinc oxide (ZnO) electrodes with one, four, and eight ZnO layers.
Raquele Lima Moreira, Luis Paulo Mourão dos Santos, Francisco Carlos Carneiro Soares Salomão, Eduardo B. Barros, Igor Frota Vasconcelos   +4 more
doaj   +1 more source

Stress analysis in semiconductor devices by Kelvin probe force microscopy

, 2022
The determination of built-in strain in semiconductor devices with nanometer spatial resolution and high sensitivity is needed for the characterization of nanoscale electronic devices.
Paul, S., Fuchs, F., Vogel, D., Rodriguez, P., Zahn, Dietrich R.T., Reuter, Danny, Sheremet, E., Geßner, Thomas, Haas, S., Zienert, Andreas, Hietschold, M., Schuster, Jörg   +11 more
core  

Atomic ordering of GaInP studied by Kelvin probe force microscopy [PDF]

, 1995
journal articleThe atomic ordering of GaInP has been established and studied by a variety of methods, including transmission electron microscopy, cathodoluminescence, and photoluminescence.
Leng, Y.; Su, L.C., Stringfellow, Gerald B.; Williams, Clayton C.   +1 more
core  

Spatially Resolved High Voltage Kelvin Probe Force Microscopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale

Advanced Physics Research
Kelvin probe force microscopy (KPFM) is a well‐established scanning probe technique, used to measure surface potential accurately; it has found extensive use in the study of a range of materials phenomena.
Conor J. McCluskey, Niyorjyoti Sharma, Jesi R. Maguire, Serene Pauly, Andrew Rogers, TJ Lindsay, Kristina M. Holsgrove, Brian J. Rodriguez, Navneet Soin, John Marty Gregg, Raymond G. P. McQuaid, Amit Kumar   +11 more
doaj   +1 more source