Results 1 to 10 of about 3,573 (286)

Quantitative 3D-KPFM imaging with simultaneous electrostatic force and force gradient detection

Nanotechnology, 2015
Kelvin probe force microscopy (KPFM) is a powerful characterization technique for imaging local electrochemical and electrostatic potential distributions and has been applied across a broad range of materials and devices. Proper interpretation of the local KPFM data can be complicated, however, by convolution of the true surface potential under the tip
Liam Collins, M B Okatan, Nickolay V Lavrik   +2 more
exaly   +3 more sources

Greener Synthesis of CZTS: Structural, KPFM studies

Materials Today: Proceedings, 2018
Abstract Copper Zinc Tin sulfide (CZTS) has shown promising performance as an absorber semiconductor for solar cell devices. Due to its multicomponent nature, low cost synthesis method results in presence of secondary phases, which is nagging issue it affects optoelectronic properties.
N. Kumari, D. Varandani, B.R. Mehta
exaly   +2 more sources

Unveiling spatially resolved charge transfer in S-scheme heterojunctions via KPFM

Chinese Journal of Catalysis
Bei Cheng, Kezhen Qi
exaly   +2 more sources

C-AFM and KPFM approach to investigate the electrical properties of single grain boundaries in ZnO varistor devices

Proceedings of SPIE, 2013
Peter Supancic, Christian Teichert
exaly  

Probing the Stability of Superhydrophobic (SHP) Silane Coating on Anodized Ti Substrate Using Kelvin Probe Force Microscope (KPFM)

Transactions of the Indian Institute of Metals, 2019
K Indira, S C Vanithakumari, U Kamachi Mudali   +2 more
exaly  

Probing Local Surface Potential of Quasi‐One‐Dimensional Systems: A KPFM Study of P3HT Nanofibers

Advanced Functional Materials, 2008
Andrea Liscio, Vincenzo Palermo
exaly  

Evolution of surface adhesion property and surface charge of shale organic matter at the nanoscale: Quantitative measurements by AFM and KPFM

Applied Surface Science
Zhengfu Ning, Shanshan Yang, Zejiang Jia   +2 more
exaly  

Implementation of data-cube pump–probe KPFM on organic solar cells [PDF]

Beilstein Journal of Nanotechnology, 2020
An implementation of pump–probe Kelvin probe force microscopy (pp-KPFM) is reported that enables recording the time-resolved surface potential in single-point mode or over a 2D grid. The spectroscopic data are acquired in open z-loop configuration, which
Benjamin Grévin, Olivier Bardagot, Renaud Demadrille   +2 more
exaly   +7 more sources

KPFM surface photovoltage measurement and numerical simulation [PDF]

EPJ Photovoltaics, 2019
A method for the analysis of Kelvin probe force microscopy (KPFM) characterization of semiconductor devices is presented. It enables evaluation of the influence of defective surface layers.
Marchat Clément, Connolly James P., Kleider Jean-Paul, Alvarez José, Koduvelikulathu Lejo J., Puel Jean Baptiste   +5 more
doaj   +5 more sources

Surface potential of chalcopyrite films measured by KPFM

Physica Status Solidi (A) Applications and Materials Science, 2006
Atomic force microscopy is widely used to characterize the surface topography of a variety of samples. Kelvin probe force microscopy KPFM additionally allows determining images of the surface potential with nanometer resolution.
Sascha Sadewasser
exaly   +5 more sources