Beilstein Journal of Nanotechnology, 2023 In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination.
Zeinab Eftekhari +8 more
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Photo-response of Two-Dimensional Ruddlesden-Popper Perovskite Films for Photovoltaics [PDF]
E3S Web of Conferences, 2021 Two-dimensional (2D) Ruddlesden-Popper (RP) perovskites have emerged as a prospective candidate to address the instability issues of traditional perovskite solar cells.
Wu Gao, Cai Molang, Dai Songyuan
doaj +1 more source
Investigation of hexagonal 2D super structures by dynamic force spectroscopy : boron nitride and graphene on transition metals [PDF]
, 2012 Investigation of hexagonal 2D super structures by dynamic force spectroscopy -Boron nitride and graphene on transition metals- Inauguraldissertation zur Erlangung der Wuerde eines Doktors der Philosophie The 2D hexagonal superstructures of h-BN on
Koch, Sascha
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Compensating for artifacts in scanning near-field optical microscopy due to electrostatics
APL Photonics, 2021 Nanotechnology and modern materials science demand reliable local probing techniques on the nanoscopic length scale. Most commonly, scanning probe microscopy methods are applied in numerous variants and shades, for probing the different sample properties.
Tobias Nörenberg +4 more
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A simple KPFM-based approach for electrostatic free topographic measurements: the case of MoS2 on SiO2 [PDF]
, 2022 International audienceA simple implementation of Kelvin probe force microscopy is reported that enables recording topographic images in the absence of any component of the electrostatic force. Our approach is based on a close loop z-spectroscopy operated
Grévin, Benjamin +7 more
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Quantitative investigation of plasmonic hot-electron injection by KPFM
Applied Surface Science, 2019 Abstract Hot-electron injection is widely used in plasmonic devices. However, it is still lack of a direct theoretical model for performance prediction. This paper measures the surface potential of Au/TiO2 film by Kelvin probe force microscope (KPFM) under various conditions, and then develops a theoretical model for quantitative interpretation.
Aoqun Jian +5 more
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Workfunction fluctuations in polycrystalline TiN observed with KPFM and their impact on MOSFETs variability [PDF]
Applied Physics Letters, 2019 A more realistic approach to evaluate the impact of polycrystalline metal gates on the MOSFET variability is presented. 2D experimental workfunction maps of a polycrystalline TiN layer were obtained by Kelvin Probe Force Microscopy with a nanometer resolution.
A. Ruiz +7 more
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The role of the cantilever in Kelvin probe force microscopy measurements
Beilstein Journal of Nanotechnology, 2011 The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever.
George Elias +5 more
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(Invited) Tip Cleaning and Sample Design for High Resolution MOSCAP x-KPFM
, 2010 Kelvin probe force microscopy (KPFM) is a unique technique that can provide two dimensional potential profiles inside a working device. A procedure is described to obtain high-resolution KPFM results on ultra-high vacuum (UHV) cleaved III-V MOSCAPs ...
J.S. Lee +9 more
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Kelvin probe force microscopy in liquid using electrochemical force microscopy
Beilstein Journal of Nanotechnology, 2015 Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid–gas interface.
Liam Collins +6 more
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