Results 11 to 20 of about 3,573 (286)

KPFM - Raman Spectroscopy Coupled Technique for the Characterization of Wide Bandgap Semiconductor Devices [PDF]

open access: yesMaterials Science Forum, 2022
International audienceA non-destructive technique for the characterization of the doped regions inside wide bandgap (WBG) semiconductor structures of power devices is presented.
Mihai Lazar   +2 more
exaly   +7 more sources

Revealing of InP multi-layer stacks from KPFM measurements in the dark and under illumination

open access: yesEPJ Photovoltaics, 2022
Solar cells are complex devices, being constituted of many layers and interfaces. The study and the comprehension of the mechanisms that take place at the interfaces is crucial for efficiency improvement. This paper applies Kelvin probe force microscopy (
da Lisca Mattia   +6 more
doaj   +2 more sources

Hidden surface photovoltages revealed by pump probe KPFM [PDF]

open access: yesNanotechnology, 2021
32 pages, 9 figures, supporting information (5 SI figures), submitted for publicationIn this work, we use pump-probe Kelvin Probe Force Microscopy (pp-KPFM) to investigate light-induced surface potential dynamics in alumina-passivated crystalline silicon,
Borowik, Łukasz   +5 more
core   +6 more sources

Exploiting the KPFM capabilities to analyze at the nanoscale the impact of electrical stresses on OTFTs properties

open access: yesSolid-State Electronics, 2021
Two different Kelvin Probe Force Microscopy (KPFM) measurement configurations have been combined to evaluate at the nanoscale the effects of an electrical stress on Organic Thin Film Transistors (OTFTs) properties. As an example, Channel Hot Carrier (CHC)
A Ruiz, S Claramunt, M Porti
exaly   +2 more sources

Applying KPFM on all solid-state battery interfaces research

open access: yes, 2023
All-solid-state batteries as potential next generation batteries are attracting increasingly more attention. Compared to liquid electrolyte-based lithium-ion batteries, all-solid-state batteries have obvious advantages, including non-flammability and ...
Zhu, Chao
core   +3 more sources

Scratch testing for micro- and nanoscale evaluation of tribocharging in DLC films containing silver nanoparticles using AFM and KPFM techniques

open access: yesSurface and Coatings Technology, 2014
Scratch testing is a fast and effective method for the measurement of critical loads in order to determine the adhesion properties of coatings and their behavior in tribological applications.
Lucia Vieira   +2 more
exaly   +2 more sources

An NC-AFM and KPFM study of the adsorption of a triphenylene derivative on KBr(001) [PDF]

open access: yesBeilstein Journal of Nanotechnology, 2012
The adsorption on KBr(001) of a specially designed molecule, consisting of a flat aromatic triphenylene core equipped with six flexible propyl chains ending with polar cyano groups, is investigated by using atomic force microscopy in the noncontact mode (
André Gourdon   +5 more
core   +4 more sources

Side charge propagation in simultaneous KPFM and transport measurement of humidity exposed graphene FET sensor

open access: yesCarbon, 2023
The surface diffusion (dissipation) of charge carriers enhanced by water molecules in solution-based biosensors and ambient operating gas sensors strongly influence their resistance response, sensitivity, and stability in time. Therefore, the information
Vojtech Svarc   +2 more
exaly   +1 more source

Kelvin Probe Force Microscopy (KPFM) for nanoelectronic device characterisation [PDF]

open access: yes, 2016
This project is to develope a new method of characterization for Silicon-nano-wire (SiNW) FET and SET devices by using KPFM technology to derive the information of local surface potential change on the channel of SiNW devices.
Ye, Sheng
core   +1 more source

Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

open access: yesBeilstein Journal of Nanotechnology, 2022
Surface photovoltage (SPV) measurements are a crucial way of investigating optoelectronic and photocatalytic semiconductors. The local SPV is generally measured consecutively by Kelvin probe force microscopy (KPFM) in darkness and under illumination, in ...
Masato Miyazaki   +2 more
doaj   +1 more source

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