KPFM surface photovoltage measurement and numerical simulation [PDF]
EPJ Photovoltaics, 2019 A method for the analysis of Kelvin probe force microscopy (KPFM) characterization of semiconductor devices is presented. It enables evaluation of the influence of defective surface layers.
Marchat Clément +5 more
doaj +5 more sources
Hidden surface photovoltages revealed by pump probe KPFM [PDF]
Nanotechnology, 2022 Abstract In this work, we use pump-probe Kelvin probe force microscopy (pp-KPFM) in combination with non-contact atomic force microscopy (nc-AFM) under ultrahigh vacuum, to investigate the nature of the light-induced surface potential dynamics in alumina-passivated crystalline silicon, and in an organic bulk ...
Aubriet, Valentin +5 more
openaire +6 more sources
Applying KPFM on all solid-state battery interfaces research [PDF]
, 2023 All-solid-state batteries as potential next generation batteries are attracting increasingly more attention. Compared to liquid electrolyte-based lithium-ion batteries, all-solid-state batteries have obvious advantages, including non-flammability and higher energy density.
Zhu, Chao
openaire +3 more sources
Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices
Beilstein Journal of Nanotechnology, 2018 In this study we investigate the influence of the operation method in Kelvin probe force microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film ...
Amelie Axt +4 more
doaj +2 more sources
Adaptive filtering on KPFM data: a deep neural network approach
Machine Learning: Science and TechnologyKelvin probe force microscopy (KPFM) measurements often exhibit widely varying signal-to-noise ratios (SNR) because of non-ideal acquisition conditions, especially in time-sensitive experiments.
Dongin Yang +5 more
doaj +2 more sources
Spatially Resolved High Voltage Kelvin Probe Force Microscopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale [PDF]
Advanced Physics ResearchKelvin probe force microscopy (KPFM) is a well‐established scanning probe technique, used to measure surface potential accurately; it has found extensive use in the study of a range of materials phenomena.
Conor J. McCluskey +11 more
doaj +2 more sources
Quantifying nanoscale charge density features of contact-charged surfaces with an FEM/KPFM-hybrid approach [PDF]
, 2022 Kelvin probe force microscopy (KPFM) is a powerful tool for studying contact electrification at the nanoscale, but converting KPFM voltage maps to charge density maps is non-trivial due to long-range forces and complex system geometry.
Shafeek, L +18 more
core +2 more sources
Tapping mode, NC-AFM and KPFM data
, 2021 Tapping mode, NC-AFM and KPFM data of Flakes 1 and 2 from the manuscript "How High is a MoSe2 Monolayer?"
Rikke Plougmann (11425990)
core +1 more source
KPFM visualisation of the Schottky barrier at the interface between gold nanoparticles and silicon
Nanoscale, 2023 Gold nanoparticles (AuNPs) deposited on a doped silicon substrate induce a local band bending and a local accumulation of positive charges in a semiconductor.
Lechaptois, Luis +2 more
openaire +3 more sources
An NC-AFM and KPFM study of the adsorption of a triphenylene derivative on KBr(001) [PDF]
Beilstein Journal of Nanotechnology, 2012 The adsorption on KBr(001) of a specially designed molecule, consisting of a flat aromatic triphenylene core equipped with six flexible propyl chains ending with polar cyano groups, is investigated by using atomic force microscopy in the noncontact mode (NC-AFM) coupled to Kelvin probe force microscopy (KPFM) in ultrahigh vacuum at
Hinaut A. +5 more
openaire +3 more sources