Results 41 to 50 of about 3,573 (286)
, 2022 International audienceA simple implementation of Kelvin probe force microscopy is reported that enables recording topographic images in the absence of any component of the electrostatic force. Our approach is based on a close loop z-spectroscopy operated
Grévin, Benjamin +3 more
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APL Materials, 2023 The disordered microscopic structure of amorphous semiconductors causes the formation of band tails in the density of states (DOS) that strongly affect charge transport properties.
Luca Fabbri +5 more
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MOVPE-Grown Quantum Cascade Laser Structures Studied by Kelvin Probe Force Microscopy
Crystals, 2020 A technique for direct study of the distribution of the applied voltage within a quantum cascade laser (QCL) has been developed. The detailed profile of the potential in the laser claddings and laser core region has been obtained by gradient scanning ...
Konstantin Ladutenko +3 more
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Kelvin probe force microscopy in liquid using electrochemical force microscopy
Beilstein Journal of Nanotechnology, 2015 Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid–gas interface.
Liam Collins +6 more
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AIP Advances, 2020 We applied Kelvin probe force microscopy (KPFM) to characterize the p-n junction grown on hydride vapor-phase epitaxy GaN wafers with three different doses of the p-type dopant Mg.
Tomonori Nakamura +3 more
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Beilstein Journal of Nanotechnology, 2021 In this study, a dual phase composite (CSO-FC2O) consisting of 60 vol % Ce0.8Sm0.2O1.9 as oxygen-conductive phase and 40 vol % FeCo2O4 as electron-conductive phase was synthesized.
Kerstin Neuhaus +6 more
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Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy
Beilstein Journal of Nanotechnology, 2011 Surfaces of thin oxide films were investigated by means of a dual mode NC-AFM/STM. Apart from imaging the surface termination by NC-AFM with atomic resolution, point defects in magnesium oxide on Ag(001) and line defects in aluminum oxide on NiAl(110 ...
Thomas König +4 more
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(Invited) Tip Cleaning and Sample Design for High Resolution MOSCAP x-KPFM
, 2010 Kelvin probe force microscopy (KPFM) is a unique technique that can provide two dimensional potential profiles inside a working device. A procedure is described to obtain high-resolution KPFM results on ultra-high vacuum (UHV) cleaved III-V MOSCAPs ...
J.S. Lee +9 more
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Nanomaterials, 2023 Silver nanoclusters are valuable for a variety of applications. A combination of direct current (DC) magnetron sputtering and inert gas condensation methods, employed within an ultra-high vacuum (UHV) system, was used to generate Ag nanoclusters with an ...
Ishaq Musa +2 more
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