Results 31 to 40 of about 3,573 (286)

High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method

open access: yesData in Brief, 2020
This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface.
Young Min Park   +3 more
doaj   +1 more source

Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination

open access: yesBeilstein Journal of Nanotechnology, 2023
In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination.
Zeinab Eftekhari   +8 more
doaj   +1 more source

Photo-response of Two-Dimensional Ruddlesden-Popper Perovskite Films for Photovoltaics [PDF]

open access: yesE3S Web of Conferences, 2021
Two-dimensional (2D) Ruddlesden-Popper (RP) perovskites have emerged as a prospective candidate to address the instability issues of traditional perovskite solar cells.
Wu Gao, Cai Molang, Dai Songyuan
doaj   +1 more source

Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

open access: yesBeilstein Journal of Nanotechnology, 2018
In this study we investigate the influence of the operation method in Kelvin probe force microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film ...
Amelie Axt   +4 more
doaj   +1 more source

Compensating for artifacts in scanning near-field optical microscopy due to electrostatics

open access: yesAPL Photonics, 2021
Nanotechnology and modern materials science demand reliable local probing techniques on the nanoscopic length scale. Most commonly, scanning probe microscopy methods are applied in numerous variants and shades, for probing the different sample properties.
Tobias Nörenberg   +4 more
doaj   +1 more source

Investigation of hexagonal 2D super structures by dynamic force spectroscopy : boron nitride and graphene on transition metals [PDF]

open access: yes, 2012
Investigation of hexagonal 2D super structures by dynamic force spectroscopy -Boron nitride and graphene on transition metals- Inauguraldissertation zur Erlangung der Wuerde eines Doktors der Philosophie The 2D hexagonal superstructures of h-BN on
Koch, Sascha
core   +1 more source

Quantifying nanoscale charge density features of contact-charged surfaces with an FEM/KPFM-hybrid approach

open access: yes, 2022
Kelvin probe force microscopy (KPFM) is a powerful tool for studying contact electrification at the nanoscale, but converting KPFM voltage maps to charge density maps is non-trivial due to long-range forces and complex system geometry.
Shafeek, L   +13 more
core   +1 more source

Workfunction fluctuations in polycrystalline TiN observed with KPFM and their impact on MOSFETs variability [PDF]

open access: yesApplied Physics Letters, 2019
A more realistic approach to evaluate the impact of polycrystalline metal gates on the MOSFET variability is presented. 2D experimental workfunction maps of a polycrystalline TiN layer were obtained by Kelvin Probe Force Microscopy with a nanometer resolution.
A. Ruiz   +7 more
openaire   +2 more sources

Quantitative investigation of plasmonic hot-electron injection by KPFM

open access: yesApplied Surface Science, 2019
Abstract Hot-electron injection is widely used in plasmonic devices. However, it is still lack of a direct theoretical model for performance prediction. This paper measures the surface potential of Au/TiO2 film by Kelvin probe force microscope (KPFM) under various conditions, and then develops a theoretical model for quantitative interpretation.
Aoqun Jian   +5 more
openaire   +2 more sources

The role of the cantilever in Kelvin probe force microscopy measurements

open access: yesBeilstein Journal of Nanotechnology, 2011
The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever.
George Elias   +5 more
doaj   +1 more source

Home - About - Disclaimer - Privacy