Results 31 to 40 of about 4,574 (190)

Surface potential imaging and characterizations of a GaN p-n junction with Kelvin probe force microscopy

open access: yesAIP Advances, 2020
We applied Kelvin probe force microscopy (KPFM) to characterize the p-n junction grown on hydride vapor-phase epitaxy GaN wafers with three different doses of the p-type dopant Mg.
Tomonori Nakamura   +3 more
doaj   +1 more source

Accurate determination of band tail properties in amorphous semiconductor thin film with Kelvin probe force microscopy

open access: yesAPL Materials, 2023
The disordered microscopic structure of amorphous semiconductors causes the formation of band tails in the density of states (DOS) that strongly affect charge transport properties.
Luca Fabbri   +5 more
doaj   +1 more source

MOVPE-Grown Quantum Cascade Laser Structures Studied by Kelvin Probe Force Microscopy

open access: yesCrystals, 2020
A technique for direct study of the distribution of the applied voltage within a quantum cascade laser (QCL) has been developed. The detailed profile of the potential in the laser claddings and laser core region has been obtained by gradient scanning ...
Konstantin Ladutenko   +3 more
doaj   +1 more source

Study of selective hydrogenation using KPFM

open access: yes, 2023
The bachelor thesis deals with the possibilities of selective hydrogenation of graphene and their analysis. The theoretical part deals with the properties of carbon materials and different hydrogenation methods.
Zeman, Filip
core  

Characterization of Electronic Behavior within a 2D FET using KPFM

open access: yes, 2022
Developing a further understanding of the electronic behavior within 2D devices is a crucial step before implementing their wider use in technology. A 2D Field Effect Transistor (FET) utilizes biasing a graphene back gate to shift the chemical potential ...
Murphy, Joseph
core   +1 more source

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

open access: yesBeilstein Journal of Nanotechnology, 2011
Surfaces of thin oxide films were investigated by means of a dual mode NC-AFM/STM. Apart from imaging the surface termination by NC-AFM with atomic resolution, point defects in magnesium oxide on Ag(001) and line defects in aluminum oxide on NiAl(110 ...
Thomas König   +4 more
doaj   +1 more source

Measurement of polarization effects in dual-phase ceria-based oxygen permeation membranes using Kelvin probe force microscopy

open access: yesBeilstein Journal of Nanotechnology, 2021
In this study, a dual phase composite (CSO-FC2O) consisting of 60 vol % Ce0.8Sm0.2O1.9 as oxygen-conductive phase and 40 vol % FeCo2O4 as electron-conductive phase was synthesized.
Kerstin Neuhaus   +6 more
doaj   +1 more source

Study of charge injection mechanisms in organic field effect transistors using Kelvin Probe Force Microscopy (KPFM)

open access: yes, 2021
Cette thèse porte sur l’étude de transistors organiques en couches minces (OTFT) par la méthode de microscopie à sonde de Kelvin (KPFM), en particulier sur l’études des contacts, et sur le développement de la méthode KPFM.
Brouillard, Mélanie
core  

Research Update: Nanoscale surface potential analysis of MoS2 field-effect transistors for biomolecular detection using Kelvin probe force microscopy

open access: yesAPL Materials, 2016
We used high-resolution Kelvin probe force microscopy (KPFM) to investigate the immobilization of a prostate specific antigen (PSA) antibody by measuring the surface potential (SP) on a MoS2 surface over an extensive concentration range (1 pg/ml–100 μg ...
Min Hyung Kim   +9 more
doaj   +1 more source

Changes in plasma membrane surface potential of PC12 cells as measured by Kelvin probe force microscopy. [PDF]

open access: yesPLoS ONE, 2012
The plasma membrane of a cell not only works as a physical barrier but also mediates the signal relay between the extracellular milieu and the cell interior.
Chia-Chang Tsai   +4 more
doaj   +1 more source

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