Results 61 to 70 of about 4,574 (190)

Probing local surface potential of quasi-one-dimensional systems: A KPFM study of P3HT nanofibers

, 2008
A new model for the quantitative analysis of Kelvin Probe Force Microscopy (KPFM) measurements of quasi-one-dimensional systems is presented. It is applied to precisely determine the local surface potential (SP) of semiconducting nanofibers of poly (3 ...
Palermo Vincenzo, Liscio Andrea, Samori Paolo   +2 more
core   +1 more source

Open loop Kelvin probe force microscopy with single and multi-frequency excitation [PDF]

, 2013
Conventional Kelvin probe force microscopy (KPFM) relies on closed loop (CL) bias feedback for the determination of surface potential (SP). However, SP measured by CL-KPFM has been shown to be strongly influenced by the choice of measurement ...
Weber, Stefan A. L., Rodriguez, Brian J., Collins, Liam, et al., Kilpatrick, J. I.   +4 more
core   +1 more source

Local V OC Measurements by Kelvin Probe Force Microscopy Applied on P-I-N Radial Junction Si Nanowires

Nanoscale Research Letters, 2019
This work focuses on the extraction of the open circuit voltage (V OC) on photovoltaic nanowires by surface photovoltage (SPV) based on Kelvin probe force microscopy (KPFM) measurements.
Clément Marchat, Letian Dai, José Alvarez, Sylvain Le Gall, Jean-Paul Kleider, Soumyadeep Misra, Pere Roca i Cabarrocas   +6 more
doaj   +1 more source

Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals

Beilstein Journal of Nanotechnology, 2018
In this work, methylammonium lead tribromide (MAPbBr3) single crystals are studied by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM).
Yann Almadori, David Moerman, Jaume Llacer Martinez, Philippe Leclère, Benjamin Grévin   +4 more
doaj   +1 more source

Pulsed Force Kelvin Probe Force Microscopy

, 2020
Measurement of the contact potential difference (CPD) and work functions of materials are important in analyzing their electronic structures and surface residual charges.
Devon S. Jakob, Haomin Wang, Xiaoji G. Xu, Devon S. Jakob (6872582), Haomin Wang (220151), Xiaoji G. Xu (1715950)   +5 more
core   +1 more source

Thin NaCl films on silver (001): island growth and work function

New Journal of Physics, 2012
The surface work function (WF) and substrate temperature dependence of the NaCl thin-film growth on Ag(001) have been studied by noncontact atomic force microscopy and Kelvin probe force microscopy.
Gregory Cabailh, Claude R Henry, Clemens Barth   +2 more
doaj   +1 more source

Fundamental Aspects of Conduction in Charged ErMnO3 Domain Walls

Advanced Electronic Materials
It is now well‐established that ferroelectric domain walls, at which there are discontinuities in polarization, are usually electrically conducting. Yet, there is a dearth of rather basic information on the physics underpinning conductivity. Here, Kelvin
James McCartan, Patrick W. Turner, James P. V. McConville, Kristina Holsgrove, Charlotte Cochard, Amit Kumar, Raymond G. P. McQuaid, Dennis Meier, J. Marty Gregg   +8 more
doaj   +1 more source

Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere

Beilstein Journal of Nanotechnology, 2019
This study deals with the preparation and characterization of metallic nanoinclusions on the surface of semiconducting Bi2Se3 that could be used for an enhancement of the efficiency of thermoelectric materials.
Petr Knotek, Tomáš Plecháček, Jan Smolík, Petr Kutálek, Filip Dvořák, Milan Vlček, Jiří Navrátil, Čestmír Drašar   +7 more
doaj   +1 more source

Probing the surface electrical properties of clay minerals with electrostatic force microscopy and kelvin probe force microscopy

Materials Research Express
Many surface processes of clay minerals require in-depth understanding of their surface electrical properties, such as surface charge density, surface potential distribution, etc In this paper, electrostatic force microscopy (EFM) and Kelvin probe force ...
Zonghua Qin, Xin Nie, Wenbin Yu, Shuguang Yang, Zongke Zhou, Shuqin Yang, Quan Wan   +6 more
doaj   +1 more source

Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation

Beilstein Journal of Nanotechnology, 2019
Controlling the work function of transition metal oxides is of key importance with regard to future energy production and storage. As the majority of applications involve the use of heterostructures, the most suitable characterization technique is Kelvin
Dominik Wrana, Karol Cieślik, Wojciech Belza, Christian Rodenbücher, Krzysztof Szot, Franciszek Krok   +5 more
doaj   +1 more source