Results 31 to 40 of about 3,099 (255)

Kelvin Probe Force Microscopy (KPFM): Investigation of Local Boron Doped Emitter Regions Formed by Inkjet Boron Inks for Industrially Feasible IBC Solar Cells

open access: yes, 2014
29th European Photovoltaic Solar Energy Conference and Exhibition; 830 ...
Sommer, Daniel   +5 more
openaire   +2 more sources

Measured Contact Potential Difference (CPD) by Kelvin Probe Force Microscopy (KPFM).

open access: yes, 2017
Measured Contact Potential Difference (CPD) by Kelvin Probe Force Microscopy (KPFM).
Haifeng Zhang (137541), Ting Su (640554)
core   +1 more source

High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes [PDF]

open access: yes, 2012
Kelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force.
Brown, Keith A.   +2 more
core   +1 more source

Research Update: Nanoscale surface potential analysis of MoS2 field-effect transistors for biomolecular detection using Kelvin probe force microscopy

open access: yesAPL Materials, 2016
We used high-resolution Kelvin probe force microscopy (KPFM) to investigate the immobilization of a prostate specific antigen (PSA) antibody by measuring the surface potential (SP) on a MoS2 surface over an extensive concentration range (1 pg/ml–100 μg ...
Min Hyung Kim   +9 more
doaj   +1 more source

Quantitative Kelvin Probe Force Microscopy

open access: yes, 2009
In this paper we report on the investigation of electrostatic forces between a conductive probe and semiconducting materials by means of Kelvin probe force microscopy measurements.
Manfred Helm   +2 more
core   +1 more source

Quantitative Kelvin probe force microscopy of current-carrying devices [PDF]

open access: yes, 2013
Kelvin probe force microscopy (KPFM) should be a key tool for characterizing the device physics of nanoscale electronics because it can directly image electrostatic potentials.
Gomez, Jose R   +11 more
core   +1 more source

Surface potential imaging and characterizations of a GaN p-n junction with Kelvin probe force microscopy

open access: yesAIP Advances, 2020
We applied Kelvin probe force microscopy (KPFM) to characterize the p-n junction grown on hydride vapor-phase epitaxy GaN wafers with three different doses of the p-type dopant Mg.
Tomonori Nakamura   +3 more
doaj   +1 more source

Interfacial Modulation for High‐Efficiency Large‐Area Organic Photovoltaics and Perovskite‐Organic Tandem Solar Modules

open access: yesAdvanced Functional Materials, EarlyView.
Self‐assembled monolayers (SAMs) are promising hole‐transporting materials for organic photovoltaics (OPVs), but suffer from self‐aggregation and poor large‐area uniformity. We find that interfacial modification using nicotinic hydrazide can eliminate the residual SAM aggregates by forming energetically favorable complexes, yielding uniform SAM.
Seongwon Yoon   +10 more
wiley   +1 more source

Optical and Electrical Properties of TiO2/Co/TiO2 Multilayer Films Grown by DC Magnetron Sputtering

open access: yesAdvances in Condensed Matter Physics, 2018
Transparent oxide multilayer films of TiO2/Co/TiO2 were grown on glass substrate by DC magnetron sputtering technique. The optical and electrical properties of these films were analyzed with the aim of substituting ITO substrate in optoelectronic devices.
Marcos G. Valluzzi   +4 more
doaj   +1 more source

Exploring Pb‐Chelation Chemistry in the Crystallization Dynamics of Halide Perovskites

open access: yesAdvanced Functional Materials, EarlyView.
A mechanism of how Pb‐chelation chemistry governs coordination geometry and initial nucleation behavior at the precursor level of halide perovskite, by regulating the deprotonation state of a chelating additive, is elucidated. This allows for innovative reaction‐system design principles that promote coherent growth while suppressing defect formation in
Byeong Jun Kim   +13 more
wiley   +1 more source

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