Results 31 to 40 of about 3,384,291 (161)

Band excitation Kelvin probe force microscopy utilizing photothermal excitation [PDF]

, 2015
A multifrequency open loop Kelvin probe force microscopy (KPFM) approach utilizingphotothermal as opposed to electrical excitation is developed.
Balke, Nina, Jesse, S., Rodriguez, Brian J., Collins, Liam, et al., Qian Li, Stephen Jesse, Liam Collins, Brian J. Rodriguez, Sergei Kalinin, Nina Balke   +10 more
core   +1 more source

Toward quantitative Kelvin probe force microscopy of nanoscale potential distributions [PDF]

, 2012
Kelvin probe force spectroscopy KPFS and amp; 64257;nite element method FEM simulations were employed to investigate the averaging effect of the work function signals of nanoscale potential distributions in Kelvin probe force microscopy KPFM .
Leendertz, Caspar, Lux-Steiner, Martha, Lux Steiner, M.Ch., Sadewasser, S., Baier, Robert, Sadewasser, Sascha, Baier, R., Leendertz, C.   +7 more
core   +1 more source

Research Update: Nanoscale surface potential analysis of MoS2 field-effect transistors for biomolecular detection using Kelvin probe force microscopy

APL Materials, 2016
We used high-resolution Kelvin probe force microscopy (KPFM) to investigate the immobilization of a prostate specific antigen (PSA) antibody by measuring the surface potential (SP) on a MoS2 surface over an extensive concentration range (1 pg/ml–100 μg ...
Min Hyung Kim, Heekyeong Park, Hyungbeen Lee, Kihwan Nam, Seokhwan Jeong, Inturu Omkaram, Dae Sung Yoon, Sei Young Lee, Sunkook Kim, Sang Woo Lee   +9 more
doaj   +1 more source

Optical and Electrical Properties of TiO2/Co/TiO2 Multilayer Films Grown by DC Magnetron Sputtering

Advances in Condensed Matter Physics, 2018
Transparent oxide multilayer films of TiO2/Co/TiO2 were grown on glass substrate by DC magnetron sputtering technique. The optical and electrical properties of these films were analyzed with the aim of substituting ITO substrate in optoelectronic devices.
Marcos G. Valluzzi, Lucas G. Valluzzi, Marcos Meyer, María A. Hernández-Fenollosa, Laura C. Damonte   +4 more
doaj   +1 more source

High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes [PDF]

, 2012
Kelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force.
Brown, Keith A., Satziner, Kevin J., Westervelt, Robert   +2 more
core   +1 more source

On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex

, 2018
In this work we analyzed the effect of the atomic force microscopy probe tip apex shape on Kelvin Probe Force Microscopy (KPFM) potential sensitivity and spatial resolution.
Keith J. Stevenson, Sergey Y. Luchkin
core   +1 more source

Kelvin probe force microscopy in liquid using electrochemical force microscopy

Beilstein Journal of Nanotechnology, 2015
Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid–gas interface.
Liam Collins, Stephen Jesse, Jason I. Kilpatrick, Alexander Tselev, M. Baris Okatan, Sergei V. Kalinin, Brian J. Rodriguez   +6 more
doaj   +1 more source

Surface potential imaging and characterizations of a GaN p-n junction with Kelvin probe force microscopy

AIP Advances, 2020
We applied Kelvin probe force microscopy (KPFM) to characterize the p-n junction grown on hydride vapor-phase epitaxy GaN wafers with three different doses of the p-type dopant Mg.
Tomonori Nakamura, Nobuyuki Ishida, Keisuke Sagisaka, Yasuo Koide   +3 more
doaj   +1 more source

Quantitative Kelvin Probe Force Microscopy

, 2009
In this paper we report on the investigation of electrostatic forces between a conductive probe and semiconducting materials by means of Kelvin probe force microscopy measurements.
Manfred Helm, Heidemarie Schmidt, Christine Baumgart   +2 more
core   +1 more source

Predictable behavior of organic photovoltaic cells by Kelvin probe force microscopy

, 2013
International audienceWe investigate a new way to access to the open circuit voltage (Voc) of organicphotovoltaic (OPV) cells: the Kelvin probe force microscopy (KPFM). KPFM is apowerful technique, allowing mapping the surface potential above any surface
Roche, R., R., Roche, Dumas, Philippe, Ph. DUMAS, A. L. LEREU, Lereu, Aude, L., R. ROCHE, Lereu, Aude L., L.   +7 more
core   +1 more source