Results 21 to 30 of about 3,384,291 (161)

KPFM surface photovoltage measurement and numerical simulation

EPJ Photovoltaics, 2019
A method for the analysis of Kelvin probe force microscopy (KPFM) characterization of semiconductor devices is presented. It enables evaluation of the influence of defective surface layers.
Marchat Clément, Connolly James P., Kleider Jean-Paul, Alvarez José, Koduvelikulathu Lejo J., Puel Jean Baptiste   +5 more
doaj   +1 more source

Note: Switching crosstalk on and off in Kelvin probe force microscopy [PDF]

, 2014
In Kelvin Probe Force Microscopy (KPFM) electronic crosstalk can occur between the excitation signal and probe deflection signal. Here, we demonstrate how a small modification to our commercial instrument enables us to literally switch the crosstalk on ...
Sven de Man, de Man, S.P.J., Polak, L., Wijngaarden, R., Wijngaarden, R.J.; id_orcid, Man, S.P.J. de, Leo Polak, Rinke J. Wijngaarden   +7 more
core   +1 more source

Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives

Beilstein Journal of Nanotechnology, 2023
Multilayer III–V-based solar cells are complex devices consisting of many layers and interfaces. The study and the comprehension of the mechanisms that take place at the interfaces is crucial for efficiency improvement.
Mattia da Lisca, José Alvarez, James P. Connolly, Nicolas Vaissiere, Karim Mekhazni, Jean Decobert, Jean-Paul Kleider   +6 more
doaj   +1 more source

Analysis of multi-center topological domain states in BiFeO3 nanodot arrays

Journal of Advanced Dielectrics, 2023
High-density ferroelectric BiFeO3 (BFO) nanodot arrays were developed through template-assisted tailoring of epitaxial thin films. By combining piezoresponse force microscopy (PFM) and Kelvin probe force microscopy (KPFM) imaging techniques, we found ...
Zhongwen Li, Siyi Zhang, Qingsheng Li, Hao Liu   +3 more
doaj   +1 more source

Investigation of hexagonal 2D super structures by dynamic force spectroscopy : boron nitride and graphene on transition metals [PDF]

, 2012
Investigation of hexagonal 2D super structures by dynamic force spectroscopy -Boron nitride and graphene on transition metals- Inauguraldissertation zur Erlangung der Wuerde eines Doktors der Philosophie The 2D hexagonal superstructures of h-BN on
Koch, Sascha
core   +1 more source

High-Bandwidth Multiparametric Kelvin Probe Force Microscopy With Polymer Microcantilevers

IEEE Access, 2019
Simultaneous and rapid measurement of the surface potential (SP) and nanomechanical properties (NMPs) of materials plays an important role in the study of, for example, piezoelectric materials and multi-component composites.
Hao Zhang, Xianghe Meng, Jianmin Song, Junyuan Geng, Peng Jin, Hui Xie   +5 more
doaj   +1 more source

Kelvin Probe Force Microscopy of Nanocrystalline TiO2 Photoelectrodes [PDF]

, 2013
Dye-sensitized solar cells (DSCs) provide a promising third-generation photovoltaic concept based on the spectral sensitization of awide-bandgap metal oxide.
Constable, Edwin C., Catherine E. Housecroft, Gino Günzburger, Jöhr, Res, Biljana Bozic-Weber, Housecroft, Catherine E., Alex Henning, Günzburger, Gino, J. Frommer, Glatzel, Thilo, Res Jöhr, Ernst Meyer, Meyer, Ernst, Yossi Rosenwaks, Thilo Glatzel, Henning, Alex, Edwin C. Constable, Bozic-Weber, Biljana, Rosenwaks, Yossi, Glatzel T, Constable EC, Günzburger G, Bozic-Weber B, Meyer E, Jöhr R, Housecroft CE, Henning A, Rosenwaks Y   +27 more
core   +1 more source

DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe Force Microscopy

, 2022
This paper presents the development of a novel Atomic Force Microscopy mode, enabling dc-bias-free surface potential measurements with high spatial resolution.
Poik, Mathias, Hackl, Thomas, Schitter, Georg; orcid:   +2 more
core   +1 more source

Kelvin Probe Force Microscopy (KPFM): Investigation of Local Boron Doped Emitter Regions Formed by Inkjet Boron Inks for Industrially Feasible IBC Solar Cells

, 2014
29th European Photovoltaic Solar Energy Conference and Exhibition; 830 ...
Sommer, Daniel, Fritz, Susanne, Herguth, Axel, Ohl, Sybille, Hahn, Giso, Terheiden, Barbara   +5 more
openaire   +2 more sources

Measured Contact Potential Difference (CPD) by Kelvin Probe Force Microscopy (KPFM).

, 2017
Measured Contact Potential Difference (CPD) by Kelvin Probe Force Microscopy (KPFM).
Haifeng Zhang (137541), Ting Su (640554)
core   +1 more source