Results 21 to 30 of about 3,099 (255)

Investigation of hexagonal 2D super structures by dynamic force spectroscopy : boron nitride and graphene on transition metals [PDF]

open access: yes, 2012
Investigation of hexagonal 2D super structures by dynamic force spectroscopy -Boron nitride and graphene on transition metals- Inauguraldissertation zur Erlangung der Wuerde eines Doktors der Philosophie The 2D hexagonal superstructures of h-BN on
Koch, Sascha
core   +1 more source

Toward quantitative Kelvin probe force microscopy of nanoscale potential distributions [PDF]

open access: yes, 2012
Kelvin probe force spectroscopy KPFS and amp; 64257;nite element method FEM simulations were employed to investigate the averaging effect of the work function signals of nanoscale potential distributions in Kelvin probe force microscopy KPFM .
Leendertz, Caspar   +7 more
core   +1 more source

AC Kelvin Probe Force Microscopy Enables Charge Mapping in Water [PDF]

open access: yes, 2022
Mapping charged chemical groups at the solid-liquid interface is important in many areas, ranging from colloidal systems to biomolecular interactions.
Mesquida, Patrick; orcid:   +2 more
core   +2 more sources

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

open access: yesBeilstein Journal of Nanotechnology, 2015
Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin   +6 more
doaj   +1 more source

KPFM surface photovoltage measurement and numerical simulation

open access: yesEPJ Photovoltaics, 2019
A method for the analysis of Kelvin probe force microscopy (KPFM) characterization of semiconductor devices is presented. It enables evaluation of the influence of defective surface layers.
Marchat Clément   +5 more
doaj   +1 more source

Switching crosstalk on and off in Kelvin probe force microscopy [PDF]

open access: yes, 2014
In Kelvin Probe Force Microscopy (KPFM) electronic crosstalk can occur between the excitation signal and probe deflection signal. Here, we demonstrate how a small modification to our commercial instrument enables us to literally switch the crosstalk on ...
Sven de Man   +8 more
core   +1 more source

High-Bandwidth Multiparametric Kelvin Probe Force Microscopy With Polymer Microcantilevers

open access: yesIEEE Access, 2019
Simultaneous and rapid measurement of the surface potential (SP) and nanomechanical properties (NMPs) of materials plays an important role in the study of, for example, piezoelectric materials and multi-component composites.
Hao Zhang   +5 more
doaj   +1 more source

Analysis of multi-center topological domain states in BiFeO3 nanodot arrays

open access: yesJournal of Advanced Dielectrics, 2023
High-density ferroelectric BiFeO3 (BFO) nanodot arrays were developed through template-assisted tailoring of epitaxial thin films. By combining piezoresponse force microscopy (PFM) and Kelvin probe force microscopy (KPFM) imaging techniques, we found ...
Zhongwen Li   +3 more
doaj   +1 more source

AFM tip characterization by Kelvin probe force microscopy [PDF]

open access: yes, 2010
Reliable determination of the surface potential with spatial resolution is key for understanding complex interfaces that range from nanostructured surfaces to molecular systems to biological membranes. In this context, Kelvin probe force microscopy (KPFM)
A S Foster   +16 more
core   +2 more sources

Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives

open access: yesBeilstein Journal of Nanotechnology, 2023
Multilayer III–V-based solar cells are complex devices consisting of many layers and interfaces. The study and the comprehension of the mechanisms that take place at the interfaces is crucial for efficiency improvement.
Mattia da Lisca   +6 more
doaj   +1 more source

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