Results 11 to 20 of about 3,384,291 (161)
AIP Advances, 2013 The resistive switching characteristics of TiO2 thin films were investigated using conductive atomic force microscopy (CAFM) and Kelvin probe force microscopy (KPFM).
Yuanmin Du +6 more
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Dual-heterodyne Kelvin probe force microscopy
Beilstein Journal of Nanotechnology, 2023 We present a new open-loop implementation of Kelvin probe force microscopy (KPFM) that provides access to the Fourier spectrum of the time-periodic surface electrostatic potential generated under optical (or electrical) pumping with an atomic force ...
Benjamin Grévin +3 more
doaj +2 more sources
Quantitative AC - Kelvin Probe Force Microscopy [PDF]
, 2017 This paper presents a novel feedback based Scanning Probe Microscopy method which enables quantitative surface potential measurements without the need of the DC bias of Kelvin Probe Force Microscopy.
Kohl, Dominik +2 more
core +5 more sources
AC Kelvin Probe Force Microscopy Enables Charge Mapping in Water [PDF]
, 2022 Mapping charged chemical groups at the solid-liquid interface is important in many areas, ranging from colloidal systems to biomolecular interactions.
Mesquida, Patrick; orcid: +2 more
core +2 more sources
Combined Kelvin probe force microscopy and secondary ion mass spectrometry for hydrogen detection in corroded 2024 aluminium alloy [PDF]
, 2013 The capability of Kelvin probe force microscopy (KFM) to detect and locate hydrogen in corroded 2024 aluminium alloy was demonstrated. Hydrogen was introduced inside the 2024 alloy following a cyclic corrosion test consisting of cycles of immersion in 1 ...
Blanc, Christine +5 more
core +1 more source
The effect of sample resistivity on Kelvin probe force microscopy [PDF]
, 2012 Kelvin probe force microscopy (KPFM) is a powerful technique to probe the local electronic structure of materials with atomic force microscopy. One assumption often made is that the applied bias drops fully in the tip-sample junction.
Weymouth, Alfred Jay, Giessibl, Franz J.
core +1 more source
Thin NaCl films on silver (001): island growth and work function
New Journal of Physics, 2012 The surface work function (WF) and substrate temperature dependence of the NaCl thin-film growth on Ag(001) have been studied by noncontact atomic force microscopy and Kelvin probe force microscopy.
Gregory Cabailh +2 more
doaj +1 more source
Beilstein Journal of Nanotechnology, 2022 In this paper, we derive and present quantitative expressions governing the performance of single and multifrequency Kelvin probe force microscopy (KPFM) techniques in both air and water.
Jason I. Kilpatrick +2 more
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Nanomaterials, 2023 Silver nanoclusters are valuable for a variety of applications. A combination of direct current (DC) magnetron sputtering and inert gas condensation methods, employed within an ultra-high vacuum (UHV) system, was used to generate Ag nanoclusters with an ...
Ishaq Musa +2 more
doaj +1 more source
Beilstein Journal of Nanotechnology, 2015 Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin +6 more
doaj +1 more source