Results 71 to 80 of about 3,384,291 (161)

Simulation and Verification of Tip-Induced Polarization During Kelvin Probe Force Microscopy Measurements on Film Capacitors

, 2016
Kelvin probe force microscopy (KPFM) is widely used as characterizationtool on functional heterostructures and components but it often suffers frommeasurement artifacts on such structures because the presence of the biased cantilever tip transforms the ...
V. N. Popok, K. Pedersen, D. A. Nielsen, Nielsen, Dennis Achton, Pedersen, Kjeld, Popok, Vladimir; id_orcid   +5 more
core   +1 more source

Characterization of quantum wells by cross sectional Kelvin probe force microscopy

, 2004
Cross-sectional Kelvin probe force microscopy (KPFM) in ultrahigh vacuum is used to characterize the electronic structure of InGaAs/InP quantum wells. The KPFM signal shows clear peaks at the position of the quantum wells and exhibits a systematic trend ...
Glatzel, T., Douh ret, O., Th. Glatzel, S. Anand, S. Sadewasser, Douheret, Oliver,, Anand, Srinivasan,, Anand, S., Sadewasser, S., O. Douhéret, K. Maknys, Maknys, K., Glatzel, Th.   +12 more
core   +1 more source

In-situ investigation of graphene oxide under UV irradiation: Evolution of work function

AIP Advances, 2015
Using in-situ Kelvin probe force microscopy (KPFM) to measure surface potential, we investigated the time-dependent work function evolution of solution-processed graphene oxide (GO) under ultraviolet (UV) irradiation.
Jun Li, Xiang Qi, Guolin Hao, Long Ren, Jianxin Zhong   +4 more
doaj   +1 more source

Local V OC Measurements by Kelvin Probe Force Microscopy Applied on P-I-N Radial Junction Si Nanowires

Nanoscale Research Letters, 2019
This work focuses on the extraction of the open circuit voltage (V OC) on photovoltaic nanowires by surface photovoltage (SPV) based on Kelvin probe force microscopy (KPFM) measurements.
Clément Marchat, Letian Dai, José Alvarez, Sylvain Le Gall, Jean-Paul Kleider, Soumyadeep Misra, Pere Roca i Cabarrocas   +6 more
doaj   +1 more source

Phase Transformations in Evaporated Ph‐BTBT‐10 Thin Films and Impact on the Device Performance

Advanced Materials Interfaces
This paper reports on the phase transformation occurring in evaporated thin films of the organic semiconductor 2‐decyl‐7‐phenyl[1]benzothieno[3,2‐b][1]benzothiophene (Ph‐BTBT‐10), along with its impact on the performance of organic thin‐film field‐effect
Lamiaa Fijahi, Shunya Yan, Ann Maria James, Min Zhang, Alba Cazorla, Adrián Tamayo, Jinghai Li, Carmen Ocal, Esther Barrena, Roland Resel, Marta Mas‐Torrent   +10 more
doaj   +1 more source

Study of injection and trapping mechanisms of electrical charges in thin dielectric films by Kelvin probe force microscopy (KPFM)

, 2015
One of the intrinsic properties of dielectrics is to accumulate electrical charges when subjected to external stresses (temperature, electrical field ...). This property can be helpful for some applications (DRAM...), but leads generally to failure of the device (micro-system...).
openaire   +1 more source

Charges injection investigation at metal/dielectric interfaces by Kelvin Probe Force Microscopy

, 2016
International audienceCharges injection at metal/dielectric interface and their motion in silicon nitride layer is investigated using samples with embedded lateral electrodes and surface potential measurement by Kelvin Probe Force Microscopy (KPFM ...
L. Boudou, Boudou, Laurent, G. Teyssedre, F. Mortreuil, Mortreuil, Florian, K. Makasheva, Teyssedre, G., Villeneuve-Faure, Christina, Makasheva, Kremena, C. Villeneuve-Faure, Teyssedre, Gilbert   +10 more
core   +1 more source

The Comprehensive Study of TiO₂ Blocking Layer with Complementary Electrochemical and SPM Methods for the Application in Photovoltaics

Inorganics
The blocking layer is crucial for inhibiting recombination processes in photovoltaics that utilize oxide semiconductors, such as dye-sensitized solar cells (DSSCs), quantum-dot-sensitized solar cells (QDSSCs), and perovskite solar cells.
Evgenija Milinković, Katarina Cvetanović, Marko V. Bošković, Nastasija Conić, Vladislav Jovanov, Dragomir Stanisavljev, Dana Vasiljević-Radović   +6 more
doaj   +1 more source

Charge transport in graphene-polythiophene blends as studied by Kelvin Probe Force Microscopy and transistor characterization

, 2011
Blends of reduced graphene oxide (RGO) and poly(3-hexylthiophene) (P3HT) are used as the active layer of field-effect transistors (FETs). By using sequential deposition of the two components, the density of RGO sheets can be tuned linearly, thereby ...
BELLANI, VITTORIO, R. Rizzoli, V. Bellani, Emanuele Treossi, Giulio Paolo Veronese, A. Liscio, Vincenzo Palermo, F. Rossella, Francesco Rossella, Paolo Samorì, ROSSELLA, FRANCESCO, Rita Rizzoli, G. P. Veronese, P. Samorì, Vittorio Bellani, V. Palermo, Andrea Liscio, F. Suriano, Francesco Suriano, G.P. Veronese, E. Treossi, Bellani, Vittorio, Giulio Paolo, Veronese, Suriano, Vincenzo, Palermo, Francesco, Paolo, Treossi, Andrea, Rita, Rizzoli, Samori, Rossella, Emanuele, Liscio   +37 more
core   +1 more source

Kelvin Probe Force Microscopy (KPFM) characterization of lanthanum lutetium oxide high-k dielectric thin films [PDF]

, 2013
Lanthanum lutetium oxide (LaLuO3) thin films were investigated considering their perspective application for industrial microelectronics. Scanning probe microscopy (SPM) techniques permitted to visualize the surface topography and study the electric ...
Geydt, Pavel
core   +1 more source