Results 61 to 70 of about 3,384,291 (161)

Discrete electron storage and retention in single α-MoO

Materials Today Advances
The development of high-density, energy-efficient nonvolatile memory (NVM) devices can benefit from the integration of novel charge-trapping materials with nanoscale performance.
Ayman Rezk, Saleh S. Aldarmaki, Rami Elkaffas, Yarjan Abdul Samad, Ammar Nayfeh   +4 more
doaj   +1 more source

Dual harmonic Kelvin probe force microscopy at the graphene-liquid interface [PDF]

, 2014
Kelvin probe force microscopy (KPFM) is a powerful technique for the determination of the contact potential difference (CPD) between an atomic force microscope tip and a sample under ambient and vacuum conditions.
Weber, Stefan A. L., Sergei V. Kalinin, Alexander Tselev, Stefan A. L. Weber, Ivan V. Vlassiouk, Jason I. Kilpatrick, Stephen Jesse, Kilpatrick, J. I., Vlassiouk, Ivan V., Rodriguez, Brian J., Collins, Liam, Liam Collins, Brian J. Rodriguez, et al.   +13 more
core   +1 more source

Study of the GdK2Nb5O thin film by scanning probe microscopy and X-ray diffraction methods

Journal of Advanced Dielectrics
Ferroelectric thin films of GdK2Nb5O[Formula: see text] (GKN) are considered one of the new promising materials for computer memory systems. The electric potential of the GKN surface in the near vicinity of the burnt-in Pt electrode was measured using ...
M. A. Bunin, S. M. Tarkhanyan, Yu. A Kuprina, Y. Gagou, M. El Marssi, O. A. Bunina, V. Yu. Kochegarova, I. P. Raevski   +7 more
doaj   +1 more source

Improved Kelvin probe force microscopy for imaging individual DNA molecules on insulating surfaces

, 2010
Electrostatic forces and potentials are keys in determining the interactions between biomolecules. We have recently imaged the topography and electrostatic surface potential of nucleic acid molecules on silicon surfaces using Kelvin probe force ...
Stefan Howorka, Leung, Carl, Bart W. Hoogenboom, Dario Maradan, Carl Leung, Kramer, Armin, Howorka, Stefan, Hoogenboom, Bart W., Mesquida, Patrick, Armin Kramer, Patrick Mesquida, Maradan, Dario   +11 more
core   +1 more source

Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination

Beilstein Journal of Nanotechnology, 2011
The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions.
Miriam Jaafar, Oscar Iglesias-Freire, Luis Serrano-Ramón, Manuel Ricardo Ibarra, Jose Maria de Teresa, Agustina Asenjo   +5 more
doaj   +1 more source

Noncontact atomic force and Kelvin probe force microscopy on MgO(100) and MgO(100)-supported Ba [PDF]

, 2016
Atomically-flat MgO(100) surfaces were prepared by sputtering and annealing. Noncontact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM) were used to characterize the MgO(100) surfaces.
Sasahara, A, Pang, CL, Onishi, H
core  

AFM-assisted fabrication of thiol SAM pattern with alternating quantified surface potential

Nanoscale Research Letters, 2011
Thiol self-assembled monolayers (SAMs) are widely used in many nano- and bio-technology applications. We report a new approach to create and characterize a thiol SAMs micropattern with alternating charges on a flat gold-coated substrate using atomic ...
Simons Janet, Xu Song, Moores Bradley, Leonenko Zoya   +3 more
doaj  

Correlation of resistance switching and polarization rotation in copper doped zinc oxide (ZnO:Cu) thin films studied by Scanning Probe Microscopy

Journal of Materiomics, 2019
This paper presents multiple-modes Scanning Probe Microscopy (SPM) studies on characterize the correlation of resistance switching (RS) and polarization rotation (PR) in copper doped ZnO (ZnO:Cu) thin films.
Juanxiu Xiao, Tun Seng Herng, Yang Guo, Jun Ding, Ning Wang, Kaiyang Zeng   +5 more
doaj   +1 more source

Understanding the atomic-scale contrast in Kelvin Probe Force Microscopy [PDF]

, 2009
International audienceA numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force microscopy (KPFM) is presented. Atomistic simulations of the tip-sample interaction force field have been combined with a non-contact Atomic Force
Loppacher, Christian, Nony, Laurent, Bocquet, Franck, Foster, Adam, S., Foster, Adam S., Foster, Adam,   +5 more
core   +1 more source

Imaging ferroelectric domains via charge gradient microscopy enhanced by principal component analysis

Journal of Materiomics, 2017
Local domain structures of ferroelectrics have been studied extensively using various modes of scanning probes at the nanoscale, including piezoresponse force microscopy (PFM) and Kelvin probe force microscopy (KPFM), though none of these techniques ...
Ehsan Nasr Esfahani, Xiaoyan Liu, Jiangyu Li   +2 more
doaj   +1 more source