Results 41 to 50 of about 7,385 (266)
Non-contact friction studied with pendulum AFM [PDF]
, 2014 Understanding nanoscale friction and dissipation is central to nanotechnology. The recent detection of the electronic friction drop caused by the onset of superconductivity in Nb by means of an ultrasensitive non-contact pendulum atomic force microscope (
Samadashvili, Markus
core +1 more source
The effect of sample resistivity on Kelvin probe force microscopy [PDF]
, 2012 Kelvin probe force microscopy (KPFM) is a powerful technique to probe the local electronic structure of materials with atomic force microscopy. One assumption often made is that the applied bias drops fully in the tip-sample junction.
Weymouth, Alfred Jay, Giessibl, Franz J.
core +1 more source
Beilstein Journal of Nanotechnology, 2011 The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions.
Miriam Jaafar +5 more
doaj +1 more source
Thin NaCl films on silver (001): island growth and work function
New Journal of Physics, 2012 The surface work function (WF) and substrate temperature dependence of the NaCl thin-film growth on Ag(001) have been studied by noncontact atomic force microscopy and Kelvin probe force microscopy.
Gregory Cabailh +2 more
doaj +1 more source
Kelvin Probe Force Microscopy by Dissipative Electrostatic Force Modulation [PDF]
Physical Review Applied, 2015 We report a new experimental technique for Kelvin probe force microscopy (KPFM) using the dissipation signal of frequency modulation atomic force microscopy for bias voltage feedback. It features a simple implementation and faster scanning as it requires no low frequency modulation.
Miyahara, Yoichi +3 more
openaire +2 more sources
Understanding the Atomic-Scale Contrast in Kelvin Probe Force Microscopy [PDF]
Physical Review Letters, 2009 A numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force microscopy (KPFM) is presented. Atomistic simulations of the tip-sample interaction force field have been combined with a non-contact Atomic Force Microscope/KPFM simulator.
Nony, Laurent +3 more
openaire +4 more sources
Toward quantitative Kelvin probe force microscopy of nanoscale potential distributions [PDF]
, 2012 Kelvin probe force spectroscopy KPFS and amp; 64257;nite element method FEM simulations were employed to investigate the averaging effect of the work function signals of nanoscale potential distributions in Kelvin probe force microscopy KPFM .
Leendertz, Caspar +7 more
core +1 more source
Beilstein Journal of Nanotechnology, 2015 Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin +6 more
doaj +1 more source
The importance of cantilever dynamics in the interpretation of Kelvin probe force microscopy [PDF]
Journal of Applied Physics, 2012 A realistic interpretation of the measured contact potential difference (CPD) in Kelvin probe force microscopy (KPFM) is crucial in order to extract meaningful information about the sample. Central to this interpretation is a method to include contributions from the macroscopic cantilever arm, as well as the cone and sharp tip of a KPFM probe.
Satzinger, Kevin J. +2 more
openaire +4 more sources
Nanoscale photovoltage mapping in CZTSe/CuxSe heterostructure by using kelvin probe force microscopy
Materials Research Express, 2020 In the present work, kelvin probe force microscopy (KPFM) technique has been used to study the CZTSe/Cu _x Se bilayer interface prepared by multi-step deposition and selenization process of metal precursors.
Manoj Vishwakarma +4 more
doaj +1 more source