Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications. [PDF]
PLoS ONE, 2017 Charge trapping properties of electrons and holes in copper-doped zinc oxide (ZnO:Cu) films have been studied by scanning probe microscopy. We investigated the surface potential dependence on the voltage and duration applied to the copper-doped ZnO films
Ting Su, Haifeng Zhang
doaj +1 more source
Combined Kelvin probe force microscopy and secondary ion mass spectrometry for hydrogen detection in corroded 2024 aluminium alloy [PDF]
, 2013 The capability of Kelvin probe force microscopy (KFM) to detect and locate hydrogen in corroded 2024 aluminium alloy was demonstrated. Hydrogen was introduced inside the 2024 alloy following a cyclic corrosion test consisting of cycles of immersion in 1 ...
Blanc, Christine +5 more
core +1 more source
MOVPE-Grown Quantum Cascade Laser Structures Studied by Kelvin Probe Force Microscopy
Crystals, 2020 A technique for direct study of the distribution of the applied voltage within a quantum cascade laser (QCL) has been developed. The detailed profile of the potential in the laser claddings and laser core region has been obtained by gradient scanning ...
Konstantin Ladutenko +3 more
doaj +1 more source
Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy. [PDF]
ACS Nano, 2018 There are currently no experimental techniques that combine atomic-resolution imaging with elemental sensitivity and chemical fingerprinting on single molecules. The advent of using molecular-modified tips in noncontact atomic force microscopy (nc-AFM) has made it possible to image (planar) molecules with atomic resolution.
Schulz F +5 more
europepmc +6 more sources
Communications Chemistry, 2021 Rutile TiO2 is a prominent photocatalyst for overall water splitting, but the on-surface activation of hydrogen atoms is still not fully understood. Here, the authors use atomic force and kelvin probe force microscopy to study the lateral manipulation of
Yuuki Adachi +3 more
doaj +1 more source
High-Bandwidth Multiparametric Kelvin Probe Force Microscopy With Polymer Microcantilevers
IEEE Access, 2019 Simultaneous and rapid measurement of the surface potential (SP) and nanomechanical properties (NMPs) of materials plays an important role in the study of, for example, piezoelectric materials and multi-component composites.
Hao Zhang +5 more
doaj +1 more source
Resolving surface potential variation in Ge/MoS2 heterostructures with Kelvin probe force microscopy
AIP Advances, 2021 In this work, we employ an atomic force microscopy-based technique, Kelvin probe force microscopy, to analyze heterogeneities of four different 2D/3D Ge/MoS2 heterostructures with Ge chemical vapor deposition (CVD) time.
Sanguk Woo +6 more
doaj +1 more source
The effect of sample resistivity on Kelvin probe force microscopy [PDF]
, 2012 Kelvin probe force microscopy (KPFM) is a powerful technique to probe the local electronic structure of materials with atomic force microscopy. One assumption often made is that the applied bias drops fully in the tip-sample junction.
Weymouth, Alfred Jay, Giessibl, Franz J.
core +1 more source
Beilstein Journal of Nanotechnology, 2011 The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions.
Miriam Jaafar +5 more
doaj +1 more source
Thin NaCl films on silver (001): island growth and work function
New Journal of Physics, 2012 The surface work function (WF) and substrate temperature dependence of the NaCl thin-film growth on Ag(001) have been studied by noncontact atomic force microscopy and Kelvin probe force microscopy.
Gregory Cabailh +2 more
doaj +1 more source