Results 31 to 40 of about 7,385 (266)

Combined Kelvin probe force microscopy and secondary ion mass spectrometry for hydrogen detection in corroded 2024 aluminium alloy [PDF]

open access: yes, 2013
The capability of Kelvin probe force microscopy (KFM) to detect and locate hydrogen in corroded 2024 aluminium alloy was demonstrated. Hydrogen was introduced inside the 2024 alloy following a cyclic corrosion test consisting of cycles of immersion in 1 ...
Blanc, Christine   +5 more
core   +1 more source

MOVPE-Grown Quantum Cascade Laser Structures Studied by Kelvin Probe Force Microscopy

open access: yesCrystals, 2020
A technique for direct study of the distribution of the applied voltage within a quantum cascade laser (QCL) has been developed. The detailed profile of the potential in the laser claddings and laser core region has been obtained by gradient scanning ...
Konstantin Ladutenko   +3 more
doaj   +1 more source

Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications. [PDF]

open access: yesPLoS ONE, 2017
Charge trapping properties of electrons and holes in copper-doped zinc oxide (ZnO:Cu) films have been studied by scanning probe microscopy. We investigated the surface potential dependence on the voltage and duration applied to the copper-doped ZnO films
Ting Su, Haifeng Zhang
doaj   +1 more source

The nature of condensed single molecules : local electronic and mechanical characteristics [PDF]

open access: yes, 2014
In order to advance the performance of molecule based electronic devices a detailed and fundamental knowledge about the underlying physical aspects is mandatory.
Fremy, Sweetlana Deva
core   +1 more source

ARMScope – the versatile platform for scanning probe microscopy systems

open access: yesMetrology and Measurement Systems, 2020
Scanning probe microscopy (SPM) since its invention in the 80’s became very popular in examination of many different sample parameters, both in university and industry. This was the effect of bringing this technology closer to the operator.
Świadkowski Bartosz   +8 more
doaj   +1 more source

Single hydrogen atom manipulation for reversible deprotonation of water on a rutile TiO2 (110) surface

open access: yesCommunications Chemistry, 2021
Rutile TiO2 is a prominent photocatalyst for overall water splitting, but the on-surface activation of hydrogen atoms is still not fully understood. Here, the authors use atomic force and kelvin probe force microscopy to study the lateral manipulation of
Yuuki Adachi   +3 more
doaj   +1 more source

High-Bandwidth Multiparametric Kelvin Probe Force Microscopy With Polymer Microcantilevers

open access: yesIEEE Access, 2019
Simultaneous and rapid measurement of the surface potential (SP) and nanomechanical properties (NMPs) of materials plays an important role in the study of, for example, piezoelectric materials and multi-component composites.
Hao Zhang   +5 more
doaj   +1 more source

Resolving surface potential variation in Ge/MoS2 heterostructures with Kelvin probe force microscopy

open access: yesAIP Advances, 2021
In this work, we employ an atomic force microscopy-based technique, Kelvin probe force microscopy, to analyze heterogeneities of four different 2D/3D Ge/MoS2 heterostructures with Ge chemical vapor deposition (CVD) time.
Sanguk Woo   +6 more
doaj   +1 more source

Characterization of a home-built low temperature scanning probe microscopy system [PDF]

open access: yes, 2011
The continuing advancement of technology is the driving force behind science and fundamental research. Scanning probe instruments still have a major impact in nanoscience and technology, because they provide a link between the macroscopic world and ...
Thai, Quang Thanh
core   +1 more source

Moving towards high carrier mobility power devices in silicon and silicon carbide [PDF]

open access: yes, 2016
This thesis reports on recent progress regarding the characterization, design and fabrication of modern power semiconductor devices in Silicon (Si) as well as in the promising wide band gap material Silicon Carbide (SiC).
Rossmann, Harald R.
core   +1 more source

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