Results 11 to 20 of about 3,386,570 (260)
Kelvin probe force microscopy of nanocrystalline TiO2 photoelectrodes [PDF]
Beilstein Journal of Nanotechnology, 2013 Dye-sensitized solar cells (DSCs) provide a promising third-generation photovoltaic concept based on the spectral sensitization of a wide-bandgap metal oxide.
Alex Henning +8 more
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The role of the cantilever in Kelvin probe force microscopy measurements [PDF]
Beilstein Journal of Nanotechnology, 2011 The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever.
George Elias +5 more
doaj +5 more sources
Kelvin probe force microscopy for material characterization [PDF]
Microscopy, 2022 Abstract Kelvin probe force microscopy is a scanning probe method for imaging the surface potential by atomic force microscopy. The surface potential is one of the most important surface properties and is correlated to e.g. the work function, surface dipoles, localized surface charges and structural properties.
Thilo Glatzel, Urs Gysin, Ernst Meyer
openaire +4 more sources
Quantitative Kelvin Probe Force Microscopy
MRS Proceedings, 2009 AbstractIn this paper we report on the investigation of electrostatic forces between a conductive probe and semiconducting materials by means of Kelvin probe force microscopy measurements. Due to the formation of an asymmetric electric dipole at the semiconductor surface, the measured KPFM bias is related with the energy difference between Fermi energy
Baumgart, C., Helm, M., Schmidt, H.
openaire +3 more sources
Quantitative AC - Kelvin Probe Force Microscopy [PDF]
Microelectronic Engineering, 2017 This paper presents a novel feedback based Scanning Probe Microscopy method which enables quantitative surface potential measurements without the need of the DC bias of Kelvin Probe Force Microscopy. In addition to the sinusoidal excitation signal at frequency , a sinusoidal signal with the frequency 2 is applied to the conductive cantilever.
Kohl, Dominik +2 more
core +8 more sources
Signal reversal in Kelvin-probe force microscopy
Review of Scientific Instruments, 2019 Kelvin-probe force microscopy is a measurement mode of atomic force microscopy, which is used to quantitatively map the electrical surface potential of a sample. Inadequate hardware and electronic design can lead to signal cross talk and, in consequence, false results.
P. Mesquida, D. Kohl, G. Schitter
core +5 more sources
Potential Dip in Organic Photovoltaics Probed by Cross-sectional Kelvin Probe Force Microscopy [PDF]
Nanoscale Research Letters, 2018 Cross-sectional potential distribution of high open-circuit voltage bulk heterojunction photovoltaic device was measured using Kelvin probe force microscopy.
Jongjin Lee, Jaemin Kong
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Kelvin probe force microscopy for local characterisation of active nanoelectronic devices [PDF]
Beilstein Journal of Nanotechnology, 2015 Frequency modulated Kelvin probe force microscopy (FM-KFM) is the method of choice for high resolution measurements of local surface potentials, yet on coarse topographic structures most researchers revert to amplitude modulated lift-mode techniques for ...
Tino Wagner +6 more
doaj +2 more sources
Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals [PDF]
Beilstein Journal of Nanotechnology, 2018 In this work, methylammonium lead tribromide (MAPbBr3) single crystals are studied by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM).
Yann Almadori +4 more
doaj +2 more sources
AIP Advances, 2013 The resistive switching characteristics of TiO2 thin films were investigated using conductive atomic force microscopy (CAFM) and Kelvin probe force microscopy (KPFM).
Yuanmin Du +6 more
doaj +2 more sources