Kelvin probe force microscopy for material characterization [PDF]
Microscopy, 2022 Abstract Kelvin probe force microscopy is a scanning probe method for imaging the surface potential by atomic force microscopy. The surface potential is one of the most important surface properties and is correlated to e.g. the work function, surface dipoles, localized surface charges and structural properties.
Thilo Glatzel, Urs Gysin, Ernst Meyer
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The role of the cantilever in Kelvin probe force microscopy measurements [PDF]
Beilstein Journal of Nanotechnology, 2011 The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever.
George Elias +5 more
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Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2020 Kelvin probe force microscopy is a scanning probe technique used to quantify the local electrostatic potential of a surface. In common implementations, the bias voltage between the tip and the sample is modulated.
Christian Ritz +2 more
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Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy [PDF]
Light: Science & Applications, 2021 Organic–inorganic halide perovskites are emerging materials for photovoltaic applications with certified power conversion efficiencies (PCEs) over 25%.
Ting-Xiao Qin +7 more
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Potential Dip in Organic Photovoltaics Probed by Cross-sectional Kelvin Probe Force Microscopy [PDF]
Nanoscale Research Letters, 2018 Cross-sectional potential distribution of high open-circuit voltage bulk heterojunction photovoltaic device was measured using Kelvin probe force microscopy.
Jongjin Lee, Jaemin Kong
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Kelvin probe force microscopy for local characterisation of active nanoelectronic devices [PDF]
Beilstein Journal of Nanotechnology, 2015 Frequency modulated Kelvin probe force microscopy (FM-KFM) is the method of choice for high resolution measurements of local surface potentials, yet on coarse topographic structures most researchers revert to amplitude modulated lift-mode techniques for ...
Tino Wagner +6 more
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Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy. [PDF]
ACS Nano, 2018 There are currently no experimental techniques that combine atomic-resolution imaging with elemental sensitivity and chemical fingerprinting on single molecules. The advent of using molecular-modified tips in noncontact atomic force microscopy (nc-AFM) has made it possible to image (planar) molecules with atomic resolution.
Schulz F +5 more
europepmc +6 more sources
Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals [PDF]
Beilstein Journal of Nanotechnology, 2018 In this work, methylammonium lead tribromide (MAPbBr3) single crystals are studied by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM).
Yann Almadori +4 more
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High spatial resolution Kelvin probe force microscopy with coaxial probes [PDF]
Nanotechnology, 2012 Kelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force. The spatial resolution of KPFM is intrinsically limited by the long range of the electrostatic interaction, which includes contributions from the macroscopic ...
Brown, Keith A. +2 more
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AIP Advances, 2013 The resistive switching characteristics of TiO2 thin films were investigated using conductive atomic force microscopy (CAFM) and Kelvin probe force microscopy (KPFM).
Yuanmin Du +6 more
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