Multidimensional‐Encoded High‐Fidelity Spectrometers With a Floating‐Base Bipolar Junction
A floating‐base bipolar junction photodetector enables multidimensional spectral encoding through synergistic gate‐ and drain‐bias modulation of interfacial barrier matching. The resulting complementary spectral responses form a diverse, weakly correlated response matrix, enabling robust and high‐fidelity spectral reconstruction even at sub‐nanoampere ...
Sang‐Hyeon Lee +11 more
wiley +1 more source
Heteroengineering‐Induced Electronic Reconstruction for Ammonium‐Ion Energy Storage
An integrated electronic reconstruction behavior is induced by local heteroengineering on VO2(B) electrode material surface of NH4+ supercapacitor, rationally modulating the electronic structure, enabling enhanced intrinsic conductivity and extra driving force for NH4+ intercalation reaction.
Ji‐Chi Liu +11 more
wiley +1 more source
On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex
In this work we analyzed the effect of the atomic force microscopy probe tip apex shape on Kelvin Probe Force Microscopy (KPFM) potential sensitivity and spatial resolution.
Keith J. Stevenson, Sergey Y. Luchkin
core +1 more source
Ferroelectric Quantum Dots for Retinomorphic In‐Sensor Computing
This work has provided a protocol for fabricating retinomorphic phototransistors by integrating ferroelectric ligands with quantum dots. The resulting device combines ferroelectricity, optical responsiveness, and low‐power operation to enable adaptive signal amplification and high recognition accuracy under low‐light conditions, while supporting ...
Tingyu Long +26 more
wiley +1 more source
Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides [PDF]
We report on a quantitative use of Kelvin probe force microscopy (KPFM) for the analysis of charge injection in thin oxides. Here, thin dielectrics are investigated through an atomic force microscopy tip that is used as a movable (virtual) top-electrode.
Kim, M. +27 more
core +1 more source
n‐Type Polymer Radio Frequency Rectifiers Operating at 18.5 GHz
Combining an n‐doped polymer semiconductor with wafer‐scale asymmetric planar electrodes featuring work function‐engineered contacts yields radio‐frequency diodes and rectifying circuits operating at up to 18.5 GHz. The devices combine scalable manufacturing with an operating frequency previously unattainable by large‐area organic electronics ...
Lazaros Panagiotidis +19 more
wiley +1 more source
Laser‐Assisted Phase Engineering of 2D MoS2 for Efficient Solution‐Processed Electronics
Here, local laser‐assisted phase transition from solution‐processed phase‐pure 1T′ to 2H MoS2 is shown to critically depend on the irradiation atmosphere. While processing in air leads to damaged insulating regions, inert conditions yield semiconducting 2H domains, enabling direct field‐effect transistor patterning with optimized lateral 1T′‐2H MoS2 ...
Anna Zhuravlova +10 more
wiley +1 more source
The Nobility of Second Phase Particles in S-65 Beryllium Studied by Scanning Kelvin Probe Force Microscopy [PDF]
Scanning Kelvin probe force microscopy has been employed to examine the galvanic activity of a range of second phase particles present in beryllium that are believed to have a role in the localised corrosion of the metal.
Harvey, A, Watts, JF, Mallinson, CF
core +1 more source
Emergent Spin Supersolids in Frustrated Quantum Materials
This review highlights developments in the study of spin super‐solids in frustrated quantum materials. Advanced experimental characterizations and computational studies enable a comprehensive understanding of the driving mechanisms of spin super‐solidity in various layered transition‐metal compounds, bridging materials, experiments, and theory aspects.
Yixuan Huang +2 more
wiley +1 more source
Probing single biomolecules with atomic force microscopy [PDF]
Fritz J, Anselmetti D, Jarchow J, Fernandez-Busquets X. Probing single biomolecules with atomic force microscopy. Journal of structural biology. 1997;119(2):165-171.During the last years, atomic force microscopy (AFM) has developed from a microscopy tool
Fritz, Jürgen +3 more
core +1 more source

