Results 241 to 250 of about 226,979 (300)

Nanoscale Characterization of Nanomaterial-Based Systems: Mechanisms, Experimental Methods, and Challenges in Probing Corrosion, Mechanical, and Tribological Properties. [PDF]

Nanomaterials (Basel)
Hoque MA, Yao CW.
europepmc   +1 more source

Molecular Views of Mineral Carbonation: Reaction of CO₂ with the Wollastonite (100) Surface. [PDF]

ACS Nano
Conti A, Lezuo L, Hoheneder A, Vaníčková E, Aloi DA, Steiger-Thirsfeld A, Heuser D, Abart R, Mittendorfer F, Schmid M, Diebold U, Franceschi G.   +11 more
europepmc   +1 more source

Morphological evolution of silicon surfaces nanopatterned by focused ion beam irradiation. [PDF]

Sci Rep
Bhowmik D.
europepmc   +1 more source

Beyond Seamless: Unexpected Defective Merging in Single-Orientation Graphene. [PDF]

Small Sci
Wang Z, Wang J, Exposito D, Krayev A, He SM, Zheng X, Hennighausen Z, Brihuega I, Jeong SY, Kong J.   +9 more
europepmc   +1 more source

Effect of Salivary Contamination on the Surface Integrity and Corrosion Resistance of Dental Implants.

J Pharm Bioallied Sci
Madhad V, Marwaha J, Caliaperoumal SK, Bhalla ND, Kaushal S, Malhotra A.   +5 more
europepmc   +1 more source

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Atomic force microscopy and other scanning probe microscopies

Current Opinion in Chemical Biology, 1998
The highlight of the past year is the unfolding and refolding of the muscle protein titin in the atomic force microscope. A related highlight in the intersection between experiment and theory is a recent review of the effects of molecular forces on biochemical kinetics.
Helen, Hansma, Lía, Pietrasanta
openaire   +5 more sources

Combined Scanning Electrochemical−Atomic Force Microscopy

Analytical Chemistry, 1999
A combined scanning electrochemical microscope (SECM)-atomic force microscope (AFM) is described. The instrument permits the first simultaneous topographical and electrochemical measurements at surfaces, under fluid, with high spatial resolution. Simple probe tips suitable for SECM-AFM, have been fabricated by coating flattened and etched Pt microwires
J V, Macpherson, P R, Unwin
openaire   +4 more sources

Rotational scanning atomic force microscopy

Nanotechnology, 2017
A non-raster scanning technique for atomic force microscopy (AFM) imaging which combines rotational and translational motion is presented. The use of rotational motion for the fast scan axis allows us to significantly increase the scanning speed while imaging a large area (diameter > 30 μm). An image reconstruction algorithm and the factors influencing
A, Ulčinas, Š, Vaitekonis
openaire   +2 more sources

Fast spiral-scan atomic force microscopy

Nanotechnology, 2009
In this paper, we describe a new scanning technique for fast atomic force microscopy. In this method, the sample is scanned in a spiral pattern instead of the well established raster pattern. A spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying amplitudes to the x-axis and y-axis of an atomic force ...
Mahmood, I. A., Moheimani, S. O. Reza
openaire   +2 more sources

Scanning in atomic force microscopy

2009 IEEE International Conference on Robotics and Automation, 2009
In this paper, we present an adaptive scanning approach for atomic force microscopy (AFM) imaging. Our simulation results demonstrate that this new approach can achieve approximately one order of magnitude better scanning efficiency over current scanning method.
null Dongdong Zhang, null Xiaoping Qian
openaire   +1 more source