Results 151 to 160 of about 770,384 (397)
Advanced Engineering Materials, Volume 27, Issue 8, April 2025.The MaterialDigital initiative drives the digital transformation of material science by promoting findable, accessible, interoperable, and reusable principles and enhancing data interoperability. This article explores the role of scientific workflows, highlights challenges in their adoption, and introduces the Workflow Store as a key tool for sharing ...
Simon Bekemeier +37 more
wiley +1 more source
Morphological Investigations on Carbon-Black Particles by Atomic Force Microscopy [PDF]
, 1994 W. Niedermeier +4 more
openalex +1 more source
Plasmonic Induced Potential in Metal-Semiconductor Composits [PDF]
arXiv, 2015 We utilize experimental tools such as conductive atomic force microscopy and electrostatic force microscopy on photo-excited arrays of gold nanoparticles on indium tin oxide substrate. The nanoparticles are partially covered by a thin semiconductor polymer.
arxiv
Advanced Engineering Materials, Volume 27, Issue 7, April 2025.This article critically reviews the recent advances in the development of nanomaterial‐based inks derived from 2D nanomaterials and how the addition of 2D nanomaterials alters the rheology of different polymers for 3D printing. The review further explores the application of 3D‐printed structures in the electronics, sensor, and energy sectors.
Amanuel Gebrekrstos +3 more
wiley +1 more source
Cautions to predicate multiferroic by atomic force microscopy
AIP Advances, 2017 With the ever-increasing research activities in multiferroic driven by its profound physics and enormous potential for application, magnetic force microscopy (MFM), as a variety of atomic force microscope (AFM), has been ...
Chen Liu +5 more
doaj +1 more source
Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces [PDF]
, 1991 Dror Sarid +3 more
openalex +1 more source
An improved transform theory for estimation of number density distribution of colloidal particles on a surface: A method for colloidal-probe atomic force microscopy [PDF]
arXiv, 2017 In the short letter, we explain an improved transform theory for colloidal-probe atomic force microscopy (CP-AFM). CP-AFM can measure a force curve between the colloidal probe and a wall surface in a colloidal dispersion. The transform theory can estimate the normalized number density distribution of the colloidal particles on the wall from the force ...
arxiv
Advanced Engineering Materials, Volume 27, Issue 7, April 2025.In this study, the effect of specific ball‐milling energy (SBME) on the mechanical and corrosion properties of graphene nanoplatelets (GNPs) Zn matrix composites is presented. GNPs are uniformly dispersed in the Zn powder mixtures at the optimal SBME of 32.82 kJ g−1.
Humayun Kabir +3 more
wiley +1 more source
Stripe noise removal in conductive atomic force microscopy
Scientific ReportsConductive atomic force microscopy (c-AFM) can provide simultaneous maps of the topography and electrical current flow through materials with high spatial resolution and it is playing an increasingly important role in the characterization of novel ...
Mian Li +4 more
doaj +1 more source
Advanced Engineering Materials, EarlyView.A novel approach for alloy development in laser powder bed fusion is introduced. Instead of producing massive samples of one composition at a time, prepressed powder bed samples produced from powder mixtures are processed. Guidelines for the selection of precursor powders are developed.
Felix Großwendt +6 more
wiley +1 more source