Results 181 to 190 of about 129,486 (213)

Equilibrium Capillary Forces with Atomic Force Microscopy

Physical Review Letters, 2007
We present measurements of equilibrium forces resulting from capillary condensation. The results give access to the ultralow interfacial tensions between the capillary bridge and the coexisting bulk phase. We demonstrate this with solutions of associative polymers and an aqueous mixture of gelatin and dextran, with interfacial tensions around 10 microN/
Sprakel, J.H.B., Besseling, N.A.M., Leermakers, F.A.M., Cohen Stuart, M.A.   +3 more
openaire   +3 more sources

Introduction to Atomic Force Microscopy

2011
Atomic force microscopy (AFM) is an invaluable tool not only to obtain high-resolution topographical images, but also to determine certain physical properties of specimens, such as their mechanical properties and composition. In addition to the wide range of applications, from materials science to biology, this technique can be operated in a number of ...
openaire   +3 more sources

Atomic Force Microscopy in Nanomedicine

2006
The combination of AFM with conventional techniques, as well as AFM itself, allows answering biomedical questions of high interest. We could show this clearly for CFTR with single molecule imaging and observation of structural dynamics in native cell membranes. AFM also allows identification and determination of CFTR at single molecule level.
Andreas Ebner, Hans Oberleithner, Dessy Nikova, Hermann Schillers, Peter Hinterdorfer, Tobias Lange   +5 more
openaire   +2 more sources

Measurement Methods in Atomic Force Microscopy

2011
This chapter is introductory to the measurements: it explains different measurement techniques both for imaging and for force spectroscopy, on which most of the AFM experiments rely. It gives a general overview of the different techniques and of the output expected from the instrument; therefore it is, at a basic level, a good tool to properly start a ...
Torre, B., Canale, C., Ricci, D., Braga, P. C.   +3 more
openaire   +3 more sources

Noise in Atomic Force Microscopy

2015
In topographic images, the noise in the vertical position of the tip (i.e. the noise in the tip-sample distance) should be considerably smaller than the topography signal on the sample which we want to measure.
openaire   +2 more sources

Static Atomic Force Microscopy

2015
In static atomic force microscopy the force between the tip and sample leads to a deflection of the cantilever according to Hooke’s law.
openaire   +2 more sources

Electrochemical ion insertion from the atomic to the device scale

Nature Reviews Materials, 2021
Aditya Sood, Andrey D Poletayev, Daniel A Cogswell   +2 more
exaly  

Machine Learning Force Fields

Chemical Reviews, 2021
Oliver T Unke, Stefan Chmiela, Huziel E Sauceda   +2 more
exaly  

Screening and Surveillance for the Early Detection of Colorectal Cancer and Adenomatous Polyps, 2008: A Joint Guideline from the American Cancer Society, the US Multi-Society Task Force on Colorectal Cancer, and the American College of Radiology

Ca-A Cancer Journal for Clinicians, 2008
Robert A Smith, Theodore R Levin, Perry J Pickhardt   +2 more
exaly  

Chemical Synthesis of Single Atomic Site Catalysts

Chemical Reviews, 2020
Yuanjun Chen, Dingsheng Wang, Yadong Li
exaly