Results 11 to 20 of about 115,866 (251)
High-frequency multimodal atomic force microscopy
Beilstein Journal of Nanotechnology, 2014 Multifrequency atomic force microscopy imaging has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample.
Adrian P. Nievergelt +3 more
doaj +1 more source
Atomic force microscopy of anisotropic silicone magnetoactive composites [PDF]
E3S Web of Conferences, 2023 New anisotropic magnetically active elastomers using carbonyl iron micrometer size ferromagnetic fillers in the silicone matrix were synthesized. Samples with orientation of the outer magnetic field strength vector applied in perpendicular or in parallel
Valiev Hammat +4 more
doaj +1 more source
Force Sensing on Cells and Tissues by Atomic Force Microscopy
Sensors, 2022 Biosensors are aimed at detecting tiny physical and chemical stimuli in biological systems. Physical forces are ubiquitous, being implied in all cellular processes, including cell adhesion, migration, and differentiation.
Hatice Holuigue +8 more
doaj +1 more source
Polynomial force approximations and multifrequency atomic force microscopy
Beilstein Journal of Nanotechnology, 2013 We present polynomial force reconstruction from experimental intermodulation atomic force microscopy (ImAFM) data. We study the tip–surface force during a slow surface approach and compare the results with amplitude-dependence force spectroscopy (ADFS ...
Daniel Platz +3 more
doaj +1 more source
Atomic Force Microscopy: An Introduction
, 2017 Imaging of nano-sized particles and sample features is crucial in a variety of research fields. For instance in biological sciences, where it is paramount to investigate structures at the single particle level. Often two-dimensional images are not sufficient and further information such as topography and mechanical properties are required. Furthermore,
Piontek, Melissa C, Roos, Wouter H
openaire +3 more sources
Piezoresistive sensors for atomic force microscopy
Journal of Telecommunications and Information Technology, 2001 An important element in microelectronics is the comparison of the modelling and measurements results of the real semiconductor devices. Our paper describes the final results of numerical simulation of a micromechanical process sequence of the atomic ...
Tomasz Dębski +6 more
doaj +1 more source
Combined Traction Force–Atomic Force Microscopy Measurements of Neuronal Cells
Biomimetics, 2022 In the course of the development of the nervous system, neuronal cells extend (grow) axons, which navigate over distances of the order of many cell diameters to reach target dendrites from other neurons and establish neuronal circuits.
Udathari Kumarasinghe +2 more
doaj +1 more source
Microscopy Today, 1992 The basic principles of atomic force microscopy are discussed. Various deflection sensors are described and compared with each other. A simple theoretical basis of the fundamental forces, such as van der Waals, electrostatic, magnetic, capillary, ionic repulsion and frictional forces, is given and the relevant experimental work is summarized.
openaire +2 more sources
Clay surface characteristics using atomic force microscopy
Revista Facultad de Ingeniería Universidad de Antioquia, 2018 El primer componente para la fabricación de productos de mampostería para la construcción es la arcilla, la cual aporta la plasticidad que facilita el moldeo y el manejo del producto. El segundo componente es el feldespato en su formación como alúmina (
Ricardo Andrés García-León +2 more
doaj +3 more sources
Nanophotonics, 2019 Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information.
Jahan Nusrat +6 more
doaj +1 more source