Results 301 to 310 of about 410,646 (334)
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Atomic Force Microscopy

1993
Abstract This chapter discusses atomic force microscopy (AFM), focusing on the methods for atomic force detection. Although the force detection always requires a cantilever, there are two types of modes: the static mode and the dynamic mode. The general design and the typical method of manufacturing of the cantilevers are discussed.
openaire   +1 more source

Electrochemical ion insertion from the atomic to the device scale

Nature Reviews Materials, 2021
Aditya Sood   +2 more
exaly  

Machine Learning Force Fields

Chemical Reviews, 2021
Oliver T Unke   +2 more
exaly  

MICROSCOPY | Atomic Force Microscopy

1999
W. Richard Bowen   +3 more
openaire   +1 more source

MICROSCOPY | Atomic Force Microscopy

2014
C.J. Wright   +3 more
openaire   +1 more source

Atomic Force Microscopy

2022
Andrew A. Gewirth, John R. LaGraff
openaire   +1 more source

Chemical Synthesis of Single Atomic Site Catalysts

Chemical Reviews, 2020
Yuanjun Chen, Dingsheng Wang, Yadong Li
exaly  

Atomic force microscopy

Nature, 1990
C. B. Prater, H. J. Butt, P. K. Hansma
openaire   +1 more source

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