Results 81 to 90 of about 3,281,000 (281)
Significant nanoscale oxygen diffusion coefficient variations are measured in ferroelectric hafnium zirconium oxide films with grain boundaries and electrode interfaces exhibiting values 104 times larger than the grain cores. Overall coefficients are 10X larger for films prepared with metal nitride electrodes compared to refractory metals. New insights
Liron Shvilberg +6 more
wiley +1 more source
Atomic Force Microscopy (AFM) can create images of biomolecules under near-native conditions but suffers from limited lateral resolution due to the finite AFM tip size and recording frequency.
Creighton M Lisowski +2 more
doaj +1 more source
Quantitative Nano-characterization of Polymers Using Atomic Force Microscopy
The present article offers an overview on the use of atomic force microscopy (AFM) to characterize the nanomechanical properties of polymers. AFM imaging reveals the conformations of polymer molecules at solid– liquid interfaces.
Milad Radiom +9 more
doaj +1 more source
We use scanning nitrogen vacancy magnetometry to directly image the weak in‐plane magnetic moments in mixed phase BiFeO3 at the nanoscale and quantify the local magnetic moments to be 18.8±2.0 μB/nm2 in the rhombohedral‐like phase and 1.5±0.6 μB/nm2 in the well‐known non‐magnetic tetragonal‐like phase.
Lei Wang +14 more
wiley +1 more source
AFM Calculated Parameters of Morphology Investigation of Spin Coated MZO (M = Al, Sn, Cd, Co) Layers [PDF]
This paper reports on the deposition and surface properties of the pure and doped zinc oxide layers produced by spin coating route. Pure and metallic (Al, Sn, Cd, Co) doped ZnO films are characterized by mean of atomic force microscopy (AFM).
M. Benhaliliba +2 more
doaj
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) of single atoms and molecules on ultrathin insulating films have led to a wealth of novel observations and insights.
Gerhard Meyer +3 more
doaj +1 more source
30 years of atomic force microscopy (AFM)
Background This collection is to celebrate the 30th anniversary of atomic force microscopy (AFM). March 3, 1986 saw publication of the land-marking paper "Atomic force microscope" by G. Binnig, C. G. Quate and C. Gerber (Phys Rev Lett, 56 (1986) 930-933, citations >8,800) with the motivation to invent "a new type of microscope capable of ...
openaire +1 more source
Glissile Interphase Boundaries Enable Collective Phase Switching in Epitaxial Polar Oxides
A triple point is identified in the phase diagram of low‐symmetry epitaxial BiFeO3 thin film along with an extended regime of phase competition associated with a flattened energy landscape. The electromechanical response is shown to be governed by correlated interphase‐boundary motion, including scale‐free avalanche dynamics characteristic of systems ...
Mohammad Moein Seyfouri +11 more
wiley +1 more source
High-speed atomic force microscopy: Imaging and force spectroscopy [PDF]
International audienceKeywords: High-speed atomic force microscopy High-speed force spectroscopy Membrane protein Membrane structure Titin Actin cortex a b s t r a c t Atomic force microscopy (AFM) is the type of scanning probe microscopy that is ...
Frédéric Eghiaian +9 more
core +1 more source
Structure‐Guided Dynamical Mechanics in Bioinspired Double Twisted Laminated Thin Films
This work explores a dynamic mechanistic study of crack propagation and puncture testing via real‐time monitoring of crack initiation, propagation, and termination through nature‐inspired single and double twisted architectures fabricated from cellulose nanocrystals.
Justin Brackenridge +4 more
wiley +1 more source

