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Experimental Evidence for the Impact of Copper Microstructure on Residual Stress of Through Silicon Via

open access: yesAdvanced Electronic Materials, EarlyView.
The impact of Cu microstructure on the thermomechanical residual stress of TSVs with a diameter of 3 μm$\umu{\rm m}$ is investigated by comparing Raman stress imaging and EBSD grain characterization. By correlating Raman‐imaged TSV stress with Cu grain structure, direct experimental evidence is provided to highlight the direct correlation between ...
Shuhang Lyu, Thomas Beechem, Tiwei Wei
wiley   +1 more source

A Batteryless Wireless Microphone Using RF Backscatter. [PDF]

open access: yesProc ACM Interact Mob Wearable Ubiquitous Technol
Wang Q, Qian C, Yan P, Zhang S, Zeng H.
europepmc   +1 more source

Europe-wide maps of biomass density based on satellite remote sensing data for 2017, 2020, 2021 and 2023. [PDF]

open access: yesData Brief
Santoro M   +8 more
europepmc   +1 more source
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Backscatter Communication Assisted by Reconfigurable Intelligent Surfaces

Proceedings of the IEEE, 2022
Gang Yang, Qianqian Zhang, Ruizhe Long
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Is Backscatter Link Stronger than Direct Link in Reconfigurable Intelligent Surface-Assisted System?

IEEE Communications Letters, 2020
Gongpu Wang   +2 more
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