Results 231 to 240 of about 1,818,251 (309)

Testing the Ce Limit of Mass Bias Correction Using ¹⁴⁵Nd/¹⁴²Nd as Normalizing Ratio in Radiogenic Neodymium Isotope Analysis by MC-ICP-MS. [PDF]

Rapid Commun Mass Spectrom
Struve T, Zander M, Pahnke K.
europepmc   +1 more source

Leveraging Symbolic Artificial Intelligence and Fuzzy Logic for Materials Science: A Review of Methods, Challenges, and Applications to Scarce and Imperfect Experimental Data

Advanced Engineering Materials, EarlyView.
This article explores the transformative potential of symbolic artificial intelligence (AI) in the field of materials science, particularly in leveraging experimental data. The article presents several symbolic AI models and discusses their applications in materials science.
Ahmed Amrani, Mohamed‐Ali Belloum, Laurence Boudet, Valentin Fouillard, Edwin Friedmann, Guillaume Lacharme, Ali Mahmoud, Jean‐Philippe Poli   +7 more
wiley   +1 more source

Bias Correction in Datasets

The increasing reliance on machine learning to support decision-making scenarios with high social impact, particularly in financial and in criminal contexts, has raised concerns about the fairness of such decisions. The field of Fair Machine Learning has emerged to provide a response to these concerns and to ensure that the employment of machine ...
openaire   +1 more source

FastNano Liquid: An Automated Platform for Small‐Angle X‐ray Scattering‐Based Materials Discovery

Advanced Engineering Materials, EarlyView.
We present FastNano Liquid, an automated small‐ and wide‐angle X‐ray scattering platform for the combined synthesis and characterization of (nano)materials. The platform is coupled to varied reactor workflows for both in situ studies of reaction kinetics and ex situ screening of synthesis conditions to support machine learning‐guided exploration ...
Pierre‐Baptiste Flandrin, Émeline Cournède, Jens Krarup, Michael Lesa, Foyzul Hasan, Amandine Séné, Arnaud Lahouati, David Benhaiem, Jérémie‐Luc Sanchez, Simon Delacroix, Thierry Gacoin, Fabienne Testard, Damien Faivre, David Carriere, Corinne Chevallard, Olivier Taché, Mark A. Levenstein   +16 more
wiley   +1 more source

Detecting Anomalous Cell Behavior in Electrochemical Battery Testing Using Machine Learning

Advanced Engineering Materials, EarlyView.
Machine‐learning‐based screening enables automated identification of anomalous battery cells from complementary electrochemical tests. A curated battery database supports configuration‐aware comparison of rate‐capability and impedance data. Supervised classification of rate‐test data achieves 90% accuracy, while CNN‐VAE‐based impedance analysis reaches
Minu Rose, Sanxchep Sharma, Veit Königer, Vincent Nebel, Jonas Oehm, Christian Weisenberger, Laura Bies, Volker Knoblauch   +7 more
wiley   +1 more source

Fairness and bias correction in machine learning for depression prediction across four study populations. [PDF]

Sci Rep
Dang VN, Cascarano A, Mulder RH, Cecil C, Zuluaga MA, Hernández-González J, Lekadir K.   +6 more
europepmc   +1 more source

Printed Integrated Logic Circuits Based on Chitosan‐Gated Organic Transistors for Future Edible Systems

Advanced Functional Materials, EarlyView.
Edible electronics needs integrated logic circuits for computation and control. This work presents a potentially edible printed chitosan‐gated transistor with a design optimized for integration in circuits. Its implementation in integrated logic gates and circuits operating at low voltage (0.7 V) is demonstrated, as well as the compatibility with an ...
Giulia Coco, Valerio Francesco Annese, Valerio Galli, Ilaria Penna, Debora Russo, Marina Veronesi, Rita Scarpelli, Stefania Sabella, Mario Caironi   +8 more
wiley   +1 more source

Benefits of the Curious Behavior of Bayesian Hierarchical Item Response Theory Models-An in-Depth Investigation and Bias Correction. [PDF]

Appl Psychol Meas
König C, Alexandrowicz RW.
europepmc   +1 more source

Intermediate Resistive State in Wafer‐Scale Vertical MoS2 Memristors Through Lateral Silver Filament Growth for Artificial Synapse Applications

Advanced Functional Materials, EarlyView.
In MOCVD MoS2 memristors, a current compliance‐regulated Ag filament mechanism is revealed. The filament ruptures spontaneously during volatile switching, while subsequent growth proceeds vertically through the MoS2 layers and then laterally along the van der Waals gaps during nonvolatile switching.
Yuan Fa, Milan Buttberg, Ke Ran, Rana Walied Ahmad, Dennis Braun, Lukas Völkel, Jimin Lee, Sofía Cruces, Bart Macco, Bárbara Canto, Holger Lerch, Thorsten Wahlbrink, Holger Kalisch, Michael Heuken, Andrei Vescan, Joachim Mayer, Zhenxing Wang, Ilia Valov, Stephan Menzel, Max C. Lemme   +19 more
wiley   +1 more source

Bias correction models for electronic health records data in the presence of non-random sampling. [PDF]

Biometrics
Kim J, Anthopolos R, Zhong J.
europepmc   +1 more source