Results 191 to 200 of about 83,109 (208)
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BIST for Measuring Clock Jitter of Charge-Pump Phase-Locked Loops
IEEE Transactions on Instrumentation and Measurement, 2008exaly
A novel BIST scheme for circuit aging measurement of aerospace chips
Chinese Journal of Aeronautics, 2018exaly
LT-RTPG: a new test-per-scan BIST TPG for low switching activity
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2006exaly
A Low-Cost Concurrent BIST Scheme for Increased Dependability
IEEE Transactions on Professional Communication, 2005exaly