Results 181 to 190 of about 83,109 (208)
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BIST Methodology, Architecture and Circuits for Pre-Bond TSV Testing in 3D Stacking IC Systems
IEEE Transactions on Circuits and Systems I: Regular Papers, 2015Roshan Weerasekera, Minkyu Je
exaly
On improving test quality of scan-based BIST
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2000Cheng, Tim Kwang-Ting
exaly
A New Architecture of Test Response Analyzer Based on the Berlekamp–Massey Algorithm for BIST
IEEE Transactions on Instrumentation and Measurement, 2010Cleonilson Protasio de Souza +2 more
exaly
Built-in self-test (BIST) structure for analog circuit fault diagnosis
IEEE Transactions on Instrumentation and Measurement, 1990exaly
Online BIST and BIST-based diagnosis of FPGA logic blocks
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2004exaly
A BIST TPG for Low Power Dissipation and High Fault Coverage
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2007exaly