Results 161 to 170 of about 19,898 (183)

Retiming for BIST-sequential circuits

Proceedings of ISCAS'95 - International Symposium on Circuits and Systems, 2002
Pseudoexhaustive BIST of sequential circuits consists of breaking all cycles in the circuit, partitioning the obtained acyclic circuit by placing some segmentation cells in the circuit, and balancing the partitioned circuit by introducing (or selecting in the scan path) additional flip-flops as delays in order to apply combinational TPG methods, In ...
Samir Lejmi, Bozena Kaminska, Bechir Ayari   +2 more
openaire   +3 more sources

Circular BIST with partial scan

International Test Conference 1988 Proceeding@m_New Frontiers in Testing, 2003
A BIST (built-in self test) methodology that uses the circular BIST technique to perform a random test of sequential logic circuits is presented. The fault coverage obtained using this technique is supplemented by deterministic tests that are presented to the CUT (circuit under test) by configuring the circular path as a partial scan chain.
M. M. Pradhan, E. J. O'Brien, S. L. Lam, James Beausang   +3 more
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Shrinking wide compressors [BIST]

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1995
Quite often built-in self-test (BIST) designs make use of multiple-input signature registers (MISR's) to compress the test data. Normally a MISR includes a stage for every signal that it is sampling. In some applications this leads to very wide MISR's that may include several hundred stages.
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Bit-flipping BIST

Proceedings of International Conference on Computer Aided Design, 2002
Hans-Joachim Wunderlich, Gundolf Kiefer
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BIST Logistics

2023
Marty Huitt, Gail Tolbert
openaire   +1 more source

Wo Du bist, zeigt wer Du bist – Geolokalisierung

2016
Der Begriff Geolokalisierung (Geo-Targeting, Geo-Location) beschreibt den technischen Vorgang der geografischen Lokalisation von Nutzern und Geraten im Internet (Hoeren 2008). Besonders genau ist hierbei durch die Auswertung der Funkzelle und Anwendung von GPS die Standortbestimmung von mobile devices.
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TRANSPARENT BIST FOR RAMS

Proceedings International Test Conference 1992, 2005
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Werde, der du bist und nicht bist

Nietzscheforschung, 2019
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RAM BIST

Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066], 2002
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The Bist, Wilrijk

2023
De Vos, Els, Wauters, Paul, Albay, Eda, Yatziv, Danielle   +3 more
openaire   +1 more source