Results 221 to 229 of about 5,308 (229)
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High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy

IEEE Transactions on Instrumentation and Measurement, 2009
Degang Chen, Randall L Geiger
exaly  

An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults

Journal of Electronic Testing: Theory and Applications (JETTA), 2006
Tian Xia
exaly  

LT-RTPG: a new test-per-scan BIST TPG for low switching activity

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2006
exaly  

BIST-based test and diagnosis of FPGA logic blocks

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2001
exaly  

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